The influence of aluminum content on the surface morphology of heavily doped (Al)GaN mesastrip structures grown by selective metalorganic vapor phase epitaxy

被引:0
作者
Lundin, W. V. [1 ,2 ]
Zavarin, E. E. [1 ,2 ]
Popov, M. G. [1 ,2 ]
Troshkov, S. I. [2 ]
Sakharov, A. V. [1 ,2 ]
Smirnova, I. P. [1 ,2 ]
Kulagina, M. M. [2 ]
Davydov, V. Yu. [2 ]
Smirnov, A. N. [2 ]
Tsatsulnikov, A. F. [1 ,2 ]
机构
[1] Russian Acad Sci, Submicron Heterostruct Microelect Res & Engn Ctr, St Petersburg 194021, Russia
[2] Russian Acad Sci, Ioffe Phys Tech Inst, St Petersburg 194021, Russia
基金
俄罗斯基础研究基金会;
关键词
MOVPE; GAS;
D O I
10.1134/S1063785015100247
中图分类号
O59 [应用物理学];
学科分类号
摘要
Heavily Si-doped Al (x) Ga1-x N mesastrip structures were grown by selective MOVPE technology. Al (x) Ga1-x N:Si mesastructures with x similar to 0.01-0.07 possess a smoother top and more even side surfaces as compared to those in analogous GaN:Si structures. During the growth of mesastructures with x similar to 0.03-0.07, a thin nanocrystalline AlN deposit appears on the Si3N4 mask. This deposit is not formed during the growth of structures with sufficiently low aluminum content.
引用
收藏
页码:1006 / 1009
页数:4
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