Study of intercalated fullerene films by medium-energy ion scattering

被引：0

作者：

Afrosimov, VV

Zakharova, IB

Il'in, RN

Makarova, TL

Sakharov, VI

Serenkov, IT

机构：

[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia

[2] St Petersburg State Tech Univ, St Petersburg 195251, Russia

来源：

PHYSICS OF THE SOLID STATE | 2002年 / 44卷 / 03期

基金：

俄罗斯基础研究基金会;

关键词：

D O I：

10.1134/1.1462687

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

This paper reports on a study of films of fullerenes and their halogen compounds, deposited on mica and silicon, by medium-energy ion scattering (MEIS). The film thickness nonuniformity was determined. A considerable increase in the halogen concentration was found at the interface, which is associated with the specific film deposition conditions. It was demonstrated that the composition of individual layers of a film can be determined using MEIS. (C) 2002 MAIK "Nauka / Interperiodica".

引用

页码：503 / 505

页数：3

共 5 条

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