Pyroelectric properties of Al(In)GaN/GaN hetero- and quantum well structures

被引:960
作者
Ambacher, O
Majewski, J
Miskys, C
Link, A
Hermann, M
Eickhoff, M
Stutzmann, M
Bernardini, F
Fiorentini, V
Tilak, V
Schaff, B
Eastman, LF
机构
[1] Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany
[2] Univ Cagliari, Ist Nazl Fis Mat, Dipartimento Fis, Cagliari, Italy
[3] Cornell Univ, Ithaca, NY 14853 USA
关键词
D O I
10.1088/0953-8984/14/13/302
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The macroscopic nonlinear pyroelectric polarization of wurtzite AlxGa1-xN, InxGa1-xN and Al(x)ln(1-x)N ternary compounds (large spontaneous polarization and piezoelectric coupling) dramatically affects the optical and electrical properties of multilayered Al(In)GaN/GaN hetero-, nanostructures and devices, due to the huge built-in electrostatic fields and bound interface charges caused by gradients in polarization at surfaces and heterointerfaces. Models of polarization-induced effects in GaN-based devices so far have assumed that polarization in ternary nitride alloys can be calculated by a linear interpolation between the limiting values of the binary compounds. We present theoretical and experimental evidence that the macroscopic polarization in nitride alloys is a nonlinear function of strain and composition. We have applied these results to interpret experimental data obtained in a number of InGaN/GaN quantum wells (QWs) as well as AlInN/GaN and AlGaN/GaN transistor structures. We find that the discrepancies between experiment and ab initio theory present so far are almost completely eliminated for the AlGaN/GaN-based heterostructures when the nonlinearity of polarization is accounted for. The realization of undoped lattice-matched AlInN/GaN heterostructures further allows us to prove the existence of a gradient in spontaneous polarization by the experimental observation of two-dimensional electron gases (2DEGs). The confinement of 2DEGs in InGaN/GaN QWs in combination with the measured Stark shift of excitonic recombination is used to determine the polarization-induced electric fields in nanostructures. To facilitate inclusion of the predicted nonlinear polarization in future simulations, we give an explicit prescription to calculate polarization-induced electric fields and bound interface charges for arbitrary composition in each of the tertiary III-N alloys. In addition, the theoretical and experimental results presented here allow a detailed comparison of the predicted electric fields and bound interface charges with the measured Stark shift and the sheet carrier concentration of polarization-induced 2DEGs. This comparison provides an insight into the reliability of the calculated nonlinear piezoelectric and spontaneous polarization of group III nitride ternary alloys.
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页码:3399 / 3434
页数:36
相关论文
共 75 条
[1]   Growth and applications of Group III nitrides [J].
Ambacher, O .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1998, 31 (20) :2653-2710
[2]   Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures [J].
Ambacher, O ;
Smart, J ;
Shealy, JR ;
Weimann, NG ;
Chu, K ;
Murphy, M ;
Schaff, WJ ;
Eastman, LF ;
Dimitrov, R ;
Wittmer, L ;
Stutzmann, M ;
Rieger, W ;
Hilsenbeck, J .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (06) :3222-3233
[3]   Two dimensional electron gases induced by spontaneous and piezoelectric polarization in undoped and doped AlGaN/GaN heterostructures [J].
Ambacher, O ;
Foutz, B ;
Smart, J ;
Shealy, JR ;
Weimann, NG ;
Chu, K ;
Murphy, M ;
Sierakowski, AJ ;
Schaff, WJ ;
Eastman, LF ;
Dimitrov, R ;
Mitchell, A ;
Stutzmann, M .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (01) :334-344
[4]   Determination of the Al mole fraction and the band gap bowing of epitaxial AlxGa1-xN films [J].
Angerer, H ;
Brunner, D ;
Freudenberg, F ;
Ambacher, O ;
Stutzmann, M ;
Hopler, R ;
Metzger, T ;
Born, E ;
Dollinger, G ;
Bergmaier, A ;
Karsch, S ;
Korner, HJ .
APPLIED PHYSICS LETTERS, 1997, 71 (11) :1504-1506
[5]   Piezoelectric charge densities in AlGaN/GaN HFETs [J].
Asbeck, PM ;
Yu, ET ;
Lau, SS ;
Sullivan, GJ ;
VanHove, J ;
Redwing, J .
ELECTRONICS LETTERS, 1997, 33 (14) :1230-1231
[6]   DETECTION OF FOREIGN ATOM SITES BY THEIR X-RAY FLUORESCENCE SCATTERING [J].
BATTERMAN, BW .
PHYSICAL REVIEW LETTERS, 1969, 22 (14) :703-+
[7]   Bond-length distribution in tetrahedral versus octahedral semiconductor alloys: The case of Ga1-xInxN [J].
Bellaiche, L ;
Wei, SH ;
Zunger, A .
PHYSICAL REVIEW B, 1997, 56 (21) :13872-13877
[8]   Nonlinear macroscopic polarization in III-V nitride alloys [J].
Bernardini, F ;
Fiorentini, V .
PHYSICAL REVIEW B, 2001, 64 (08)
[9]   Polarization-based calculation of the dielectric tensor of polar crystals [J].
Bernardini, F ;
Fiorentini, V ;
Vanderbilt, D .
PHYSICAL REVIEW LETTERS, 1997, 79 (20) :3958-3961
[10]   Spontaneous polarization and piezoelectric constants of III-V nitrides [J].
Bernardini, F ;
Fiorentini, V ;
Vanderbilt, D .
PHYSICAL REVIEW B, 1997, 56 (16) :10024-10027