New Multilevel Bang-Bang Phase Detector

被引:11
作者
Sanchez-Azqueta, Carlos [1 ]
Gimeno, Cecilia [1 ]
Aldea, Concepcion [1 ]
Celma, Santiago [1 ]
机构
[1] Aragon Inst Engn Res, Grp Elect Design, Zaragoza 50009, Spain
关键词
BBPD; CDR; equivalent time sampling; metastability; multilevel;
D O I
10.1109/TIM.2013.2273611
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Equivalent time oscilloscopes are widely used as an alternative to real-time oscilloscopes when high timing resolution is needed. For their correct operation, they need the trigger signal to be accurately aligned to the incoming data, which is achieved by the use of a clock and data recovery circuit (CDR). In this paper, a new multilevel bang-bang phase detector (BBPD) for CDRs is presented; the proposed phase detection scheme disregards samples taken close to the data transitions for the calculation of the phase difference between the inputs, thus eliminating metastability, one of the main issues hindering the performance of BBPDs.
引用
收藏
页码:3384 / 3386
页数:3
相关论文
共 8 条
[1]  
[Anonymous], 2002, LOOP BANDW CLOCK DAT
[2]   Fast frequency acquisition phase-frequency detector with zero blind zone in PLL [J].
Hu, W. ;
Chunglen, L. ;
Wang, X. .
ELECTRONICS LETTERS, 2007, 43 (19) :1018-1020
[3]  
Li DaFeng Li DaFeng, 2011, China Condiment, P1
[4]   A new hybrid phase detector for reduced lock time and timing jitter of phase-locked loops [J].
Li, Jiwang ;
Yuan, Fei .
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2008, 56 (03) :233-240
[5]  
Razavi B., 1996, Design of Monolithic PhaseLocked Loops and Clock Recovery CircuitsA Tutorial, DOI DOI 10.1109/9780470545331.CH23
[6]   A 0.18 μm CMOS ring VCO for clock and data recovery applications [J].
Sanchez-Azqueta, C. ;
Celma, S. ;
Aznar, F. .
MICROELECTRONICS RELIABILITY, 2011, 51 (12) :2351-2356
[7]   Phase detector for PLL-based high-speed data recovery [J].
Tang, YH ;
Geiger, RL .
ELECTRONICS LETTERS, 2002, 38 (23) :1417-1419
[8]   Frequency insensitive phase detector with fast response and very low output ripple [J].
Vyroubal, D .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2000, 49 (05) :1077-1082