Mechanical properties of free-standing graphene oxide

被引：35

作者：

Kang, Shao-Hui ^{[1
]}

Fang, Te-Hua ^{[1
]}

Hong, Zheng-Han ^{[2
]}

Chuang, Cheng-Hsin ^{[3
]}

机构：

[1] Natl Kaohsiung Univ Appl Sci, Dept Mech Engn, Kaohsiung 807, Taiwan

[2] MIRDC, Mold & Precis Machining Technol Sect, Micro Meso Mech Mfg R&D Dept, Taipei, Taiwan

[3] Southern Taiwan Univ, Dept Mech Engn, Tainan 710, Taiwan

来源：

关键词：

graphene oxide; free-standing films; mechanical properties; nanoindentation; Young's modulus; critical energy; FUNCTIONALIZED GRAPHENE; PHASE-TRANSFORMATIONS; ELASTIC PROPERTIES; FORCE MICROSCOPY; RAMAN-SPECTRA; NANOINDENTATION; INDENTATION; SHEETS; FILMS; GRAPHITE;

D O I：

10.1016/j.diamond.2013.06.016

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The mechanical properties of free-standing graphene oxide (GO) films were investigated using nanoindentation on a dynamic contact module (DCM) system. The Young's modulus, stiffness, and ultimate strength of thin films were evaluated. Nanoindentation measurements were combined with the DCM to evaluate the mechanical properties of thin films and to predict the crack length and critical energy. Electrophoretically deposited GO film, 50 similar to 60 nm in thickness, was found to have a Young's modulus of 695 +/- 53 similar to 697 +/- 15 GPa. The critical energy values for 50- and 60-nm-thick films were 0.142 similar to 0.201 and 0.479 similar to 0.596 J/m(2), respectively. Nanoindentation combined with the DCM can thus be used to obtain the mechanical properties and critical energy of thin films. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：73 / 78

页数：6

共 32 条

[1] The effect of heat treatment on formation of graphene thin films from graphene oxide nanosheets [J].

Akhavan, O. .

CARBON, 2010, 48 (02) :509-519

[2] Spherical indentation of freestanding circular thin films in the membrane regime [J].

Begley, MR ;

Mackin, TJ .

JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 2004, 52 (09) :2005-2023

[3] Large area few-layer graphene/graphite films as transparent thin conducting electrodes [J].

Cai, Weiwei ;

Zhu, Yanwu ;

Li, Xuesong ;

Piner, Richard D. ;

Ruoff, Rodney S. .

APPLIED PHYSICS LETTERS, 2009, 95 (12)

[4] Raman spectroscopy of graphene on different substrates and influence of defects [J].

Das, Anindya ;

Chakraborty, Biswanath ;

Sood, A. K. .

BULLETIN OF MATERIALS SCIENCE, 2008, 31 (03) :579-584

[5]

Domnich V., 2002, Reviews on Advanced Materials Science, V3, P1

[6] Effect of phase transformations on the shape of the unloading curve in the nanoindentation of silicon [J].

Domnich, V ;

Gogotsi, Y ;

Dub, S .

APPLIED PHYSICS LETTERS, 2000, 76 (16) :2214-2216

[7] Elasticity and nanomechanical response of Aspergillus niger spores using atomic force microscopy [J].

Fang, Te-Hua ;

Kang, Shao-Hui ;

Hong, Zheng-Han ;

Wu, Cheng-Da .

MICRON, 2012, 43 (2-3) :407-411

[8] Nanoindentation and nanoscratch characteristics of Si and GaAs [J].

Fang, TH ;

Chang, WJ ;

Lin, CM .

MICROELECTRONIC ENGINEERING, 2005, 77 (3-4) :389-398

[9] Raman spectrum of graphene and graphene layers [J].

Ferrari, A. C. ;

Meyer, J. C. ;

Scardaci, V. ;

Casiraghi, C. ;

Lazzeri, M. ;

Mauri, F. ;

Piscanec, S. ;

Jiang, D. ;

Novoselov, K. S. ;

Roth, S. ;

Geim, A. K. .

PHYSICAL REVIEW LETTERS, 2006, 97 (18)

[10] Interpretation of Raman spectra of disordered and amorphous carbon [J].

Ferrari, AC ;

Robertson, J .

PHYSICAL REVIEW B, 2000, 61 (20) :14095-14107

← 1 2 3 4 →