Guided Growth Implant Failure is a Result of Cyclic Fatigue: Explant Analysis With Scanning Electron Microscopy

被引:5
作者
Clement, Anna E. B. [1 ]
Vanderby, Ray, Jr. [2 ]
Halanski, Matthew A. [2 ]
Noonan, Kenneth J. [2 ]
机构
[1] Univ Wisconsin, Mat Sci Program, Madison, WI 53706 USA
[2] Univ Wisconsin, Sch Med & Publ Hlth, Dept Orthopaed & Rehabil, 1600 Highland Ave,6130 MFCB, Madison, WI 53792 USA
关键词
guided growth; Blount disease; implant failure; PLATE; HEMIEPIPHYSIODESIS;
D O I
10.1097/BPO.0000000000000661
中图分类号
R826.8 [整形外科学]; R782.2 [口腔颌面部整形外科学]; R726.2 [小儿整形外科学]; R62 [整形外科学(修复外科学)];
学科分类号
摘要
Background: Guided growth is often used to correct limb deformity and yet implant screw failure in modular systems has been reported. There have been no reports of plate failure and we do not know the exact mode of failure when screws do break. Methods: We report the first published case of a fractured plate in a modular plate and screw construct that was used to correct Blount disease in a child through guided growth. The implants were removed and analyzed for method of failure using scanning electron microscopy. Results: Scanning electron microscopy of the explant confirms that the mode of failure was not a result of static tension from growth. Rather, analysis confirms cyclic fatigue that led to crack propagation across the anterior side of the plate until overload caused complete plate failure. Conclusions: This analysis confirms an in vivo cyclic compression-relaxation of the growth plate presumably to weightbearing, and that when excessive may lead to implant failure as seen here in this case. Level of Evidence: Level V.
引用
收藏
页码:E37 / E42
页数:6
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