Key experimental information on intermediate-range atomic structures in amorphous Ge2Sb2Te5 phase change material

被引:25
作者
Hosokawa, Shinya [1 ,2 ]
Pilgrim, Wolf-Christian [2 ]
Hoehle, Astrid [2 ]
Szubrin, Daniel [2 ]
Boudet, Nathalie [3 ]
Berar, Jean-Francois [3 ]
Maruyama, Kenji [4 ]
机构
[1] Hiroshima Inst Technol, Ctr Mat Res Using Generat Synchrotron Radiat Faci, Hiroshima 7315193, Japan
[2] Univ Marburg, Fachbereich Chem, D-35032 Marburg, Germany
[3] Univ Grenoble 1, CNRS, Inst Neel, F-38042 Grenoble 9, France
[4] Niigata Univ, Dept Chem, Fac Sci, Niigata 9502181, Japan
关键词
X-RAY-SCATTERING; THIN-FILMS; TE ALLOYS; MEMORY; GESE2;
D O I
10.1063/1.3703570
中图分类号
O59 [应用物理学];
学科分类号
摘要
Laser-induced crystalline-amorphous phase change of Ge-Sb-Te alloys is the key mechanism enabling the fast and stable writing/erasing processes in rewritable optical storage devices, such as digital versatile disk (DVD) or blu-ray disk. Although the structural information in the amorphous phase is essential for clarifying this fast process, as well as long lasting stabilities of both the phases, experimental works were mostly limited to the short-range order by x ray absorption fine structure. Here we show both the short and intermediate-range atomic structures of amorphous DVD material, Ge2Sb2Te5 (GST), investigated by a combination of anomalous x ray scattering and reverse Monte Carlo modeling. From the obtained atomic configurations of amorphous GST, we have found that the Sb atoms and half of the Ge atoms play roles in the fast phase change process of order-disorder transition, while the remaining Ge atoms act for the proper activation energy of barriers between the amorphous and crystalline phases. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3703570]
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页数:9
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