SPECTROSCOPIC STUDY OF AMORPHOUS As2Se3:Snx AND (As2S1.5Se1.5)1-x:Snx THIN FILMS

被引:1
|
作者
Iaseniuc, O. V. [1 ]
Harea, D. V. [1 ]
Iovu, M. S. [1 ]
Colomeico, E. P. [1 ]
Harea, E. [1 ]
Cojocaru, I. A. [1 ]
Shepel, D. F.
Meshalkin, A. [1 ]
机构
[1] Moldavian Acad Sci, Inst Appl Phys, MD-2028 Kishinev, Moldova
来源
ADVANCED TOPICS IN OPTOELECTRONICS, MICROELECTRONICS, AND NANOTECHNOLOGIES VI | 2012年 / 8411卷
关键词
Chalcogenide glasses; amorphous films; optical absorption; refractive index; photodarkening; OPTICAL-CONSTANTS; SURFACE-RELIEF; RELAXATION; MODEL;
D O I
10.1117/12.956493
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The transmission spectra of bulk and thin films of (As2S1.5Se1.5)(1-x):Sn-x in the visible and near infrared (IR) regions were investigated. Doping of As2S1.5Se1.5 chalcogenide glass with tin impurities essentially reduce the absorption bands of S-H (Se-H) and H2O located at nu = 5190 cm(-1) and nu = 3617 cm(-1), respectively. The amorphous As2Se3:Sn-x and (As2S1.5Se1.5) 1-x: Snx thin films exhibit photoinduced effects under the light irradiation with photon energy above the optical band gap (h nu >= E-g), that make its perspective materials for registration of optical and holographic information. The modification of optical parameters (optical band gap E-g, absorption coefficient alpha, refractive index n) under light irradiation and heat treatment of the amorphous thin films with different amount of Sn was studied. The shift of the absorption edge after light exposure to lower energy region was observed, i.e. the effect of photodarkening take place. The dispersions curves n=f(lambda) show a modification of the refractive index n under light exposure. For the glass composition (As2S1.5Se1.5)(0.96):Sn-0.04 the change of the optical band gap Eg(opt) under light exposure was determined from 1.92+/-0.02 eV to 1.86+/-0.02 eV. The similar calculations of the optical constants were done for the amorphous films of glass compositions x=0.03 and x=0.05. The relaxation of photodarkening in amorphous As2Se3:Sn-x and (As2S1.5Se1.5)(1-x):Sn-x thin films, which is described by the stretch exponential function T(t)/T(0) = A(0)+Aexp[-(t-t(0))/tau]((1-alpha)) also was investigated. The experimental results are interpreted in framework of the model of molecular structure of chalcogenide glasses doped with tin impurities.
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页数:9
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