Life Prediction based on Degradation Amount Distribution using Composite Time Series Analysis

被引:0
作者
Wang, Li [1 ]
Zhang, Huiyan [1 ]
Xue, Hong [1 ]
机构
[1] Beiijing Technol & Business Univ, Beijing 100048, Peoples R China
来源
2012 INTERNATIONAL CONFERENCE ON MECHANICAL, INDUSTRIAL, AND MANUFACTURING ENGINEERING | 2012年 / 1卷
关键词
Degradation Test; Life Prediction; Degradation Amount Distribution; Composite Time Series;
D O I
10.1016/j.ieri.2012.06.034
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents a life prediction method to predict Degradation Amount Distribution ( DAD) of products using a composite time series modeling procedure based on degradation data. Product DAD data are treated as composite time series and described using composite time series model and utilized to predict long-term trend of degradation. A degradation test is processed for a certain electronic product and degradation data are collected for life prediction. A comparison between the predicted DAD using composite time series analysis and the predicted DAD using regression analysis of the electronic product is processed and the results show that the DAD prediction of the product using composite time series analysis is more effective than regression analysis. (C) 2012 Published by Elsevier B. V. Selection and peer review under responsibility of Information Engineering Research Institute
引用
收藏
页码:217 / 224
页数:8
相关论文
共 10 条
  • [1] Time series modeling of degradation due to outdoor weathering
    Chan, Victor
    Meeker, William Q.
    [J]. COMMUNICATIONS IN STATISTICS-THEORY AND METHODS, 2008, 37 (03) : 408 - 424
  • [2] Lifetime distribution based degradation analysis
    Chen, ZH
    Zheng, SR
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 2005, 54 (01) : 3 - 10
  • [3] [邓爱民 DENG Aimin], 2006, [宇航学报, Journal of Chinese Society of Astronautics], V27, P546
  • [4] Fu HuiMin, 2004, Journal of Mechanical Strength, V26, P164
  • [5] He Shuyuan, 2003, APPLIED TIME SERIES
  • [6] Huimin Fu, 2002, Journal of Mechanical Strength, V24, P400
  • [7] Jayaram JSR, 2005, PROCEEDINGS ANNUAL R
  • [8] Meeker W.Q., 1998, ACCELERATED DEGRADAT
  • [9] Nelson WB., 2009, ACCELERATED TESTING
  • [10] Wang Li, 2009, 8TH INTERNATIONAL CO