Examination of Bragg backscattering from crystalline quartz

被引:16
作者
Sutter, JP
Baron, AQR
Ishikawa, T
Yamazaki, H
机构
[1] JASRI, SPring 8, Sayo, Hyogo 6795198, Japan
[2] JASRI, SPring 8, Sayo, Hyogo 6795148, Japan
关键词
in organic compounds; crystal growth; X-ray diffraction; thermal expansion; phonons;
D O I
10.1016/j.jpcs.2005.09.044
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The backscattering silicon single crystals normally used for hard X-ray inelastic scattering experiments suffer from parasitic reflections and gaps in photon energy where no backscattering reflection exists. Sapphire has been proposed as a possible alternative, but quartz may have advantages over sapphire at low photon energies (5-12.5 keV). Calculations of energy widths of backscattering reflections up to 30 keV for silicon, sapphire, and quartz are compared. The quartz (11 6 0) reflection is examined at 0.03 degrees from backscattering with 0.8 meV bandwidth beam, and its energy width is measured. Finally, the thermal expansions of quartz and silicon are compared. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2306 / 2309
页数:4
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