Modeling and Analysis of Noise in Power Line Communication for Smart Metering

被引:0
作者
Panchadcharam, S. [1 ]
Taylor, G. A. [1 ]
Pisica, I. [2 ]
Irving, M. R. [3 ]
机构
[1] Brunel Univ, Brunel Inst Power Syst, Uxbridge UB8 3PH, Middx, England
[2] EPSRC, ADEPT, Swindon, Wilts, England
[3] Brunel Univ, Sch Engn & Design, Power Syst, Uxbridge, Middx, England
来源
2012 IEEE POWER AND ENERGY SOCIETY GENERAL MEETING | 2012年
关键词
Bit error rate (BER); communication systems; noise; power line communication (PLC); smart metering;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Power line communication (PLC) has been widely used in the Smart Grid environment as it represents a low cost communication solution for distribution networks and more recently smart metering. However, its instability under noisy channel conditions requires careful simulations and modelling before implementing any PLC-based solution. Modelling physical characteristics of PLC using different simulation tools has been investigated in the past and is an ongoing research challenge. In this paper, the suitability of PLC for smart metering is tested in terms of scalability and performances under different noise conditions, by using discrete event simulations for a PLC model previously validated with experimental results under the EU-funded project HiPerDNO.
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页数:8
相关论文
共 9 条
  • [1] [Anonymous], OPNET 16 0
  • [2] He Y., 2010, IEEE INT S POW LIN C
  • [3] Hrasnica H., 2000, SPIES S VOIC VID DAT
  • [4] Kellerbauer H., 2011, 2011 Proceedings of IEEE International Symposium on Power Line Communications and Its Applications (ISPLC), P213, DOI 10.1109/ISPLC.2011.5764395
  • [5] A simulation study of the PLC-MAC performance using network simulator-2
    Kim, Min-Soo
    Son, Dong-Min
    Ko, Young-Bae
    Kim, Young-Hyun
    [J]. IEEE ISPLC: 2008 IEEE INTERNATIONAL SYMPOSIUM ON POWER LINE COMMUNICATIONS AND ITS APPLICATIONS, 2008, : 99 - +
  • [6] OPEN meter, DESCR STAT OF THE 2
  • [7] Panchadcharam S., 2011, 46 INT U POW ENG C U
  • [8] Qureshi M., 2008, IEEE INT S POW LIN C
  • [9] Taylor G. A., 2010, 45 INT U POW ENG C U