Dual-wavelength sensitive AlGaN/GaN metal-insulator-semiconductor-insulator-metal ultraviolet sensor with balanced ultraviolet/visible rejection ratios

被引:21
|
作者
Lee, Chang-Ju [1 ]
Kwon, Young-Jin [1 ]
Won, Chul-Ho [1 ]
Lee, Jung-Hee [1 ]
Hahm, Sung-Ho [1 ]
机构
[1] Kyungpook Natl Univ, Coll IT Engn, Sch Elect Engn, Taegu 702701, South Korea
基金
新加坡国家研究基金会;
关键词
PHOTODETECTORS; LAYER; OXIDE;
D O I
10.1063/1.4821133
中图分类号
O59 [应用物理学];
学科分类号
摘要
We proposed and fabricated a metal-insulator-semiconductor-insulator-metal type dual-wavelength sensitive UV sensor by using an AlGaN/GaN hetero-structure layer epitaxially grown on a sapphire substrate and a thin Al2O3 layer inserted between AlGaN and Ni Schottky electrodes to reduce dark current and improve the UV/visible rejection ratio. The proposed sensor shows high photo-responsive current to both UV wavelength regimes with a significantly improved UV/visible rejection ratio under the regime of the GaN-related UV response. Cut-off wavelengths can be controlled by changing the bias below and above 10 V. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:5
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