X-ray resonant magnetic scattering from patterned multilayers

被引:5
作者
Arnalds, Unnar B. [1 ]
Hase, Thomas P. A. [2 ]
Papaioannou, Evangelos Th [1 ]
Raanaei, Hossein [3 ]
Abrudan, Radu [4 ]
Charlton, Timothy R. [5 ]
Langridge, Sean [5 ]
Hjorvarsson, Bjorgvin [1 ]
机构
[1] Uppsala Univ, Dept Phys & Astron, S-75121 Uppsala, Sweden
[2] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[3] Persian Gulf Univ, Dept Phys, Bushehr 75169, Iran
[4] Ruhr Univ Bochum, D-44780 Bochum, Germany
[5] Rutherford Appleton Lab, ISIS, Didcot OX11 0QX, Oxon, England
来源
PHYSICAL REVIEW B | 2012年 / 86卷 / 06期
基金
英国工程与自然科学研究理事会; 瑞典研究理事会;
关键词
EXCHANGE SCATTERING; NANOSTRUCTURES; FILMS;
D O I
10.1103/PhysRevB.86.064426
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on x-ray resonant magnetic scattering from laterally patterned arrays of amorphous Co68Fe24Zr8/Al2O3 multilayers. The arrays are composed of circular and ellipsoidal elements which display distinct individual magnetic responses enabling the investigation of the dependence of the observed magnetization on the scattering condition. We focus our attention to special points in reciprocal space, relating to the lateral and perpendicular structure of the samples, thereby revealing the magnetic structure of the multilayered arrays. This allows a comparison of the observed magnetization under different scattering conditions to magneto-optical measurements. The scattering data are supported by micromagnetic simulations which further enhance our understanding of the intricate charge and magnetic scattering from three dimensional patterns.
引用
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页数:9
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