IR Reflectance Imaging for Crystalline Si Solar Cell Crack Detection

被引：37

作者：

Brooks, Will S. M. ^{[1
]}

Lamb, Dan A. ^{[1
]}

Irvine, Stuart J. C. ^{[1
]}

机构：

[1] Glyndwr Univ, OpTIC, Ctr Solar Energy Res, Clwyd LL17 0JD, Denbigh, Wales

来源：

IEEE JOURNAL OF PHOTOVOLTAICS | 2015年 / 5卷 / 05期

基金：

英国工程与自然科学研究理事会;

关键词：

Defect detection; photovoltaic (PV) cells; silicon; solar cells;

D O I：

10.1109/JPHOTOV.2015.2438636

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

A novel, contactless, noninvasive, and nondestructive method of crack detection in crystalline Si solar cells has been developed. A thermal imaging camera detecting in the 7.5-13-mu m wavelength range was used to image the specular reflection of an IR source on the surface of a crystalline Si cell. The surface distortion caused by the presence of a crack was found to affect a change in the local surface normal, a phenomenon exploited to observe the change in specular reflection and the resultant distortion captured in an IR thermal image. The system has been found to reliably and reproducibly reveal cracks in Si cells that are not observable at visible wavelengths. The detection rate and temperature operating range were found to be readily tailored to the requirements of different manufacturing and inspection environments.

引用

页码：1271 / 1275

页数：5

共 18 条

[1] Review of Microcrack Detection Techniques for Silicon Solar Cells [J].

Abdelhamid, Mahmoud ;

Singh, Rajendra ;

Omar, Mohammed .

IEEE JOURNAL OF PHOTOVOLTAICS, 2014, 4 (01) :514-524

[2]

[Anonymous], PHYS STAT SOL

[3]

Bauer J., 2009, EDFA Magazine, V11, P6

[4] Crack detection and analyses using resonance ultrasonic vibrations in full-size crystalline silicon wafers [J].

Belyaev, A ;

Polupan, O ;

Dallas, W ;

Ostapenko, S ;

Hess, D ;

Wohlgemuth, J .

APPLIED PHYSICS LETTERS, 2006, 88 (11)

[5] Shunt types in crystalline silicon solar cells [J].

Breitenstein, O ;

Rakotoniaina, JP ;

Al Rifai, MH ;

Werner, M .

PROGRESS IN PHOTOVOLTAICS, 2004, 12 (07) :529-538

[6] Shunts due to laser scribing of solar cells evaluated by highly sensitive lock-in thermography [J].

Breitenstein, O ;

Langenkamp, M ;

Lang, O ;

Schirrmacher, A .

SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2001, 65 (1-4) :55-62

[7]

Brooks W. S. M., Patent No. [GB1316121.1 PCT/GB2014/052745, 13161211]

[8] Micro crack detection of multi-crystalline silicon solar wafer using machine vision techniques [J].

Chiou, Yih-Chih ;

Liu, Jian-Zong ;

Liang, Yu-Teng .

SENSOR REVIEW, 2011, 31 (02) :154-165

[9]

Chou M. S., 2001, U. S. Patent, Patent No. [2001/0054693, 20010054693]

[10]

Coletti G., 2006, P 21 EUR PHOT SOL EN, P1281

← 1 2 →