Electronic structure of epitaxial (Sr,Ca)RuO3 films studied by photoemission and x-ray absorption spectroscopy -: art. no. 085108

被引：51

作者：

Park, J

Oh, SJ

Park, JH

Kim, DM

Eom, CB

机构：

[1] Seoul Natl Univ, Sch Phys, Seoul 151742, South Korea

[2] Seoul Natl Univ, Ctr Strongly Correlated Mat Res, Seoul 151742, South Korea

[3] Pohang Univ Sci & Technol, Dept Phys, Pohang 790784, South Korea

[4] Univ Wisconsin, Dept Mat Sci & Engn, Madison, WI 53706 USA

来源：

PHYSICAL REVIEW B | 2004年 / 69卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.69.085108

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Electronic structures of epitaxial (Sr,Ca)RuO3 thin films are studied by photoemission and x-ray absorption spectroscopy using synchrotron radiation. The Ru 4d spectral weights obtained by utilizing the Cooper minimum phenomena of photoionization cross-section reveal a strong mixing between Ru 4d and O 2p states as well as the signature of electron correlation effect near the Fermi level in both SrRuO3 and CaRuO3. However the electron correlation effect seems more important in CaRuO3 than SrRuO3. The detailed shapes of the valence band are found to depend on the sample cleaning methods, where the single-crystalline films cleaned by in situ annealing show more enhanced structures in the spectra than the scraped polycrystalline samples.

引用

页数：6

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