Optical and structural properties of titanium oxide thin films prepared by sol-gel merhod

TiO2 thin films were prepared by sol gel method. The structural investigations performed by means of X-ray diffraction (XRD) technique, Scanning electronic microscopy (SEM) showed the shape structure at T=600 degrees C. The optical constants of the deposited film were obtained from the analysis of the experimental recorded transmittance spectral data over the wavelengths range 200-3000 nm. The values of some important parameters (refractive index n, dielectric constant epsilon (infinity) and thickness d), and the third order optical nonlinear susceptibility chi((3)) of TiO2 film are determined from these spectra. It has been found that the dispersion data obey the single oscillator relation of the Wemple-DiDomenico model, from which the dispersion parameters and high-frequency dielectric constant were determined. The estimation of the corresponding band gap E-g, chi((3)) and epsilon (infinity) are 2.57 eV, 0.021 x 10(-10) esu and 5.20, respectively.