Revealing distortion of carbon nanotube walls via angle-resolved X-ray spectroscopy

被引：4

作者：

Kanygin, M. A. ^{[1
,2
]}

Okotrub, A. V. ^{[1
,2
]}

Bulusheva, L. G. ^{[1
,2
]}

Vilkov, O. Y. ^{[3
]}

Hata, K. ^{[4
]}

机构：

[1] RAS, Nikolaev Inst Inorgan Chem, SB, Novosibirsk 630090, Russia

[2] Tomsk State Univ, Tomsk 634050, Russia

[3] St Petersburg State Univ, St Petersburg 198504, Russia

[4] AIST, Nanotube Res Ctr, Tsukuba, Ibaraki 3058565, Japan

来源：

CURRENT APPLIED PHYSICS | 2015年 / 15卷 / 10期

基金：

俄罗斯基础研究基金会;

关键词：

Single-walled carbon nanotubes; Angle-resolved NEXAFS; X-ray fluorescent spectroscopy; Wall distortion; ABSORPTION FINE-STRUCTURE; ELECTRONIC-STRUCTURE; GRAPHENE; ANISOTROPY; RADIATION; NEXAFS; TRANSMISSION; COMPOSITES; FREQUENCY; ALIGNMENT;

D O I：

10.1016/j.cap.2015.06.017

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Arrays of aligned single-walled carbon nanotubes (SWCNTs) produced by supergrowth method were studied by scanning electron microscopy (SEM) and angle-resolved near-edge X-ray absorption fine structure spectroscopy, which defined that nanotube disorder is 10-13 degrees and 23-27 degrees, respectively. The latter value was confirmed by X-ray fluorescent spectroscopy. The difference in the obtained angular deviations was attributed to distortion of the SWCNT walls, because the X-ray spectroscopy methods are sensitive to a local environment of probing atoms, while the SEM examines the nanotubes at a substantially larger length scale. Significant distortion (20-24 degrees) of SWCNT walls could be related to the defects introduced during the growth process. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：1111 / 1116

页数：6

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