A full ellipsometric approach to optical sensing with Bloch surface waves on photonic crystals

被引：83

作者：

Sinibaldi, Alberto ^{[1
]}

Rizzo, Riccardo ^{[1
]}

Figliozzi, Giovanni ^{[1
]}

Descrovi, Emiliano ^{[2
]}

Danz, Norbert ^{[3
]}

Munzert, Peter ^{[3
]}

Anopchenko, Aleksei ^{[1
]}

Michelotti, Francesco ^{[1
]}

机构：

[1] Univ Roma La Sapienza, Dipartimento Sci Base & Appl Ingn, I-00161 Rome, Italy

[2] Politecn Torino, Dipartimento Sci Appl & Tecnol, I-10129 Turin, Italy

[3] Fraunhofer Inst Appl Opt & Precis Engn IOF, D-07745 Jena, Germany

来源：

OPTICS EXPRESS | 2013年 / 21卷 / 20期

关键词：

ENHANCED RAMAN-SCATTERING; DIELECTRIC STRUCTURES; SENSORS; BIOSENSOR; MULTILAYERS; PROPAGATION; PERFORMANCE; PHASE;

D O I：

10.1364/OE.21.023331

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report on the investigation on the resolution of optical sensors exploiting Bloch surface waves sustained by one dimensional photonic crystals. A figure of merit is introduced to quantitatively assess the performance of such sensors and its dependency on the geometry and materials of the photonic crystal. We show that the figure of merit and the resolution can be improved by adopting a full ellipsometric phase-sensitive approach. The theoretical predictions are confirmed by experiments in which, for the first time, such type of sensors are operated in the full ellipsometric scheme. (C) 2013 Optical Society of America

引用

页码：23331 / 23344

页数：14

共 43 条

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