Displacement measurement using an optoelectronic oscillator with an intra-loop Michelson interferometer

被引：15

作者：

Lee, Jehyun ^{[1
]}

Park, Sooyoung ^{[1
]}

Seo, Dae Han ^{[1
,2
]}

Yim, Sin Hyuk ^{[1
,3
]}

Yoon, Seokchan ^{[1
]}

Cho, D. ^{[1
]}

机构：

[1] Korea Univ, Dept Phys, Seoul 136713, South Korea

[2] LG Chem, Gyeonggi Do 427710, South Korea

[3] Agcy Def Dev, Daejeon 305154, South Korea

来源：

OPTICS EXPRESS | 2016年 / 24卷 / 19期

关键词：

RANGE;

D O I：

10.1364/OE.24.021910

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report on measurement of small displacements with sub-nanometer precision using an optoelectronic oscillator (OEO) with an intra-loop Michelson interferometer. In comparison with conventional homodyne and heterodyne detection methods, where displacement appears as a power change or a phase shift, respectively, in the OEO detection, the displacement produces a shift in the oscillation frequency. In comparison with typical OEO sensors, where the frequency shift is proportional to the OEO oscillation frequency in radio-frequency domain, the frequency shift in our method with an intra-loop interferometer is proportional to an optical frequency. We constructed a hybrid apparatus and compared characteristics of the OEO and heterodyne detection methods. (C) 2016 Optical Society of America

引用

页码：21910 / 21920

页数：11

共 18 条

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