Impact of Body-Biasing Technique on Random Telegraph Noise Induced Delay Fluctuation

被引：2
|
作者：
Matsumoto, Takashi [1 ]
Kobayashi, Kazutoshi [2 ,3 ]
Onodera, Hidetoshi [1 ,3 ]
机构：
[1] Kyoto Univ, Grad Sch Informat, Dept Commun & Comp Engn, Kyoto 6068501, Japan
[2] Kyoto Inst Technol, Grad Sch Sci & Technol, Dept Elect, Kyoto 6068585, Japan
[3] CREST, JST, Tokyo 1020076, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 2013年 / 52卷 / 04期
关键词：
TEMPERATURE INSTABILITY; VARIABILITY; FREQUENCY;
D O I：
10.7567/JJAP.52.04CE05
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The statistical nature of random telegraph noise (RTN) induced delay fluctuation is described by measuring 1,655 ROs fabricated in a commercial 40 nm CMOS technology. A small number of samples have a large RTN-induced delay fluctuation. We investigated the impact of the body-biasing technique on RTN-induced circuit delay fluctuation for various substrate bias conditions. The impact of RTN-induced delay fluctuation tends to be reduced by the forward body-biasing technique, but a few ROs still have a large fluctuation. (C) 2013 The Japan Society of Applied Physics
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页数：3
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