Reliable mapping of tree cover and tree-cover change at regional, continental, and global scales is critical for understanding key aspects of ecosystem structure and function. In savannas, which are characterized by a variable mixture of trees and grasses, mapping tree cover can be especially challenging due to the highly heterogeneous nature of these ecosystems. Our objective in this article was to develop improved tools for large-scale classification of savanna tree cover in grass-dominated savanna ecosystems that vary substantially in woody cover over fine spatial scales. We used multispectral, low-resolution Moderate Resolution Imaging Spectroradiometer (MODIS) satellite imagery to identify the bands and metrics that are best suited to quantify woody cover in an area of the Serengeti National Park, Tanzania. We first used 1-m resolution panchromatic IKONOS data to quantify tree cover for February 2010 in an area of highly variable tree cover. We then upscaled the classification to MODIS (250 m) resolution. We used a 2 year time series (IKONOS date +/- 1 year) of MODIS 16 day composites to identify suitable metrics for quantifying tree cover at low resolution, and calculated and compared the explanatory power of three different variable classes for four MODIS bands using Lasso regression: longitudinal summary statistics for individual spectral bands (e.g. mean and standard deviation), Fourier harmonics, and normalized difference vegetation index (NDVI) green-up metrics. Longitudinal summary statistics showed better explanatory power (R-2 = 73% for calibration data; R-2 = 61% for validation data) than Fourier or green-up metrics. The mid-infrared, near-infrared, and NDVI bands were all important predictors of tree cover. Mean values for the time series were more important than other metrics, suggesting that multispectral data may be more valuable than within-band seasonal variation obtained from time series data for mapping tree cover. Our best model improved substantially over the MODIS Vegetation Continuous Fields product, often used for quantifying tree cover in savanna systems. Quantifying tree cover at coarse spatial resolution using remote-sensing approaches is challenging due to the low amount and high heterogeneity of tree cover in many savanna systems, and our results suggest that products that work well at global scales may be inadequate for low-tree-cover systems such as the Serengeti. We show here that, even in situations where tree cover is low (<10%) and varies considerably across space, satisfactory predictive power is possible when broad spectral data can be obtained even at coarse spatial resolution.
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Ecole Cent Paris, European Fdn New Energy Elect France, Chair Syst Sci & Energet Challenge, F-92290 Chatenay Malabry, FranceEcole Cent Paris, European Fdn New Energy Elect France, Chair Syst Sci & Energet Challenge, F-92290 Chatenay Malabry, France
Ak, Ronay
Fink, Olga
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Zurich Univ Appl Sci, Inst Data Anal & Proc Design, CH-8401 Winterthur, Switzerland
MIT, 77 Massachusetts Ave, Cambridge, MA 02139 USAEcole Cent Paris, European Fdn New Energy Elect France, Chair Syst Sci & Energet Challenge, F-92290 Chatenay Malabry, France
Fink, Olga
Zio, Enrico
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Ecole Cent Paris, European Fdn New Energy Elect France, Chair Syst Sci & Energet Challenge, F-92290 Chatenay Malabry, France
Politecn Milan, Dept Energy, I-20133 Milan, ItalyEcole Cent Paris, European Fdn New Energy Elect France, Chair Syst Sci & Energet Challenge, F-92290 Chatenay Malabry, France
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CSIR, Remote Sensing Res Unit, Meraka Inst, ZA-0001 Pretoria, South AfricaUniv Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
Wessels, Konrad J.
van den Bergh, Frans
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CSIR, Remote Sensing Res Unit, Meraka Inst, ZA-0001 Pretoria, South AfricaUniv Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
van den Bergh, Frans
Salmon, Brian P.
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Univ Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
CSIR, Remote Sensing Res Unit, Meraka Inst, ZA-0001 Pretoria, South AfricaUniv Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
Salmon, Brian P.
Steenkamp, Karen C.
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CSIR, Remote Sensing Res Unit, Meraka Inst, ZA-0001 Pretoria, South AfricaUniv Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
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Virginia Tech, Coll Nat Resources & Environm, Dept Geog, 115 Major Williams Hall, Blacksburg, VA 24061 USAVirginia Tech, Coll Nat Resources & Environm, Dept Geog, 115 Major Williams Hall, Blacksburg, VA 24061 USA
Shao, Yang
Lunetta, Ross S.
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US EPA, Natl Exposure Res Lab, 109 TW Alexander Dr, Res Triangle Pk, NC 27711 USAVirginia Tech, Coll Nat Resources & Environm, Dept Geog, 115 Major Williams Hall, Blacksburg, VA 24061 USA
Lunetta, Ross S.
Wheeler, Brandon
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Virginia Tech, Coll Nat Resources & Environm, Dept Geog, 115 Major Williams Hall, Blacksburg, VA 24061 USAVirginia Tech, Coll Nat Resources & Environm, Dept Geog, 115 Major Williams Hall, Blacksburg, VA 24061 USA
Wheeler, Brandon
Iiames, John S.
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US EPA, Natl Exposure Res Lab, 109 TW Alexander Dr, Res Triangle Pk, NC 27711 USAVirginia Tech, Coll Nat Resources & Environm, Dept Geog, 115 Major Williams Hall, Blacksburg, VA 24061 USA
Iiames, John S.
Campbell, James B.
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Virginia Tech, Coll Nat Resources & Environm, Dept Geog, 115 Major Williams Hall, Blacksburg, VA 24061 USAVirginia Tech, Coll Nat Resources & Environm, Dept Geog, 115 Major Williams Hall, Blacksburg, VA 24061 USA
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Univ Politecn Madrid, Escuela Tecn Super Ingn Ind, Dept Org Engn Business Adm & Stat, Jose Gutierrez Abascal 2, Madrid 28006, Spain
Univ Estado Rio de Janeiro, Rua Sao Francisco Xavier 524, BR-20550900 Rio De Janeiro, BrazilUniv Politecn Madrid, Escuela Tecn Super Ingn Ind, Dept Org Engn Business Adm & Stat, Jose Gutierrez Abascal 2, Madrid 28006, Spain
Assad, Daniel Bouzon Nagem
Cara, Javier
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Univ Politecn Madrid, Escuela Tecn Super Ingn Ind, Dept Org Engn Business Adm & Stat, Jose Gutierrez Abascal 2, Madrid 28006, SpainUniv Politecn Madrid, Escuela Tecn Super Ingn Ind, Dept Org Engn Business Adm & Stat, Jose Gutierrez Abascal 2, Madrid 28006, Spain
Cara, Javier
Ortega-Mier, Miguel
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Univ Politecn Madrid, Escuela Tecn Super Ingn Ind, Dept Org Engn Business Adm & Stat, Jose Gutierrez Abascal 2, Madrid 28006, SpainUniv Politecn Madrid, Escuela Tecn Super Ingn Ind, Dept Org Engn Business Adm & Stat, Jose Gutierrez Abascal 2, Madrid 28006, Spain
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Univ Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
CSIR, ZA-0002 Pretoria, South AfricaUniv Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
Grobler, T. L.
Ackermann, E. R.
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Rice Univ, Computat & Appl Math Dept, Houston, TX 77005 USAUniv Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
Ackermann, E. R.
Olivier, J. C.
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Univ Tasmania, Sch Engn, Hobart, Tas 7001, AustraliaUniv Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
Olivier, J. C.
van Zyl, A. J.
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Univ Pretoria, Dept Math & Appl Math, ZA-0002 Pretoria, South AfricaUniv Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
van Zyl, A. J.
Kleynhans, W.
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Univ Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa
CSIR, Remote Sensing Res Unit, Meraka Inst, ZA-0001 Pretoria, South AfricaUniv Pretoria, Dept Elect Elect & Comp Engn, ZA-0002 Pretoria, South Africa