Optical and excitonic properties of ZnO films

被引：28

作者：

Mihailovic, M. ^{[1
]}

Henneghien, A. -L. ^{[1
]}

Faure, S. ^{[2
]}

Disseix, P. ^{[1
]}

Leymarie, J. ^{[1
]}

Vasson, A. ^{[1
]}

Buell, D. A. ^{[3
]}

Semond, F. ^{[3
]}

Morhain, C. ^{[3
]}

Perez, J. Zuniga ^{[3
]}

机构：

[1] CNRS, UMR UBP 6602, LASMEA, F-63177 Aubiere, France

[2] Univ Montpellier 2, GES, UMR CNRS 5650, F-34095 Montpellier, France

[3] CNRS, CRHEA, F-06560 Valbonne, France

来源：

OPTICAL MATERIALS | 2009年 / 31卷 / 03期

关键词：

THIN-FILMS; PHOTOLUMINESCENCE; CONSTANTS; GAN;

D O I：

10.1016/j.optmat.2007.10.023

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Optical and excitonic properties of ZnO heterostructures are studied in order to observe the strong light-matter coupling in this material as it has been recently demonstrated in GaN. The optical index of ZnO is first studied as a function of wavelength through spectroscopic ellipsometric and reflectivity experiments oil ZnO layers grown by molecular beam epitaxy and deposited oil two different substrates: sapphire and silicon with an AlN buffer layer. The main features of the excitons: energy, oscillator strength and broadening are deduced. From the knowledge of these properties, a microcavity is then designed. The ZnO active layer is embedded between AlGaN/AlN and dielectric Bragg mirrors. The calculation of the reflectivity spectra as a function of the incident angle attests the strong coupling and a large Rabi splitting of 110 meV is expected ill such a cavity. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：532 / 536

页数：5

共 13 条

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