A near-field scanning optical microscope with a high Q-factor piezoelectric sensing element

被引:20
作者
Davydov, DN
Shelimov, KB
Haslett, TL
Moskovits, M
机构
[1] Univ Toronto, Dept Chem, Toronto, ON M5S 3H6, Canada
[2] Photon Res Ontario, Toronto, ON M5S 3H6, Canada
关键词
D O I
10.1063/1.124823
中图分类号
O59 [应用物理学];
学科分类号
摘要
A tapping-mode near-field scanning optical microscope utilizing a piezoelectric microtuning fork as its height-sensing element is described. We have developed a method for modifying and attaching an optical fiber to the tuning fork that allows the assembly to retain a Q factor of up to 9000, substantially higher than the Q factors described so far in the literature for tuning-fork-based instruments. The method involves reducing the diameter of the cladding of the optical fiber down to 17-25 mu m using several chemical etching steps, before the fiber is attached to the tuning fork. A sharp upturn in the Q factor is observed when the fiber diameter d drops below similar to 25 mu m. An analysis showing that the stretching force constant of a bent fiber is proportional to d(4) accounts for the great sensitivity of the Q factor to the fiber diameter. The high Q factors result in improved force sensitivity and allow us to construct a tapping-mode instrument without the use of additional dithering piezoelements. (C) 1999 American Institute of Physics. [S0003-6951(99)01738-6].
引用
收藏
页码:1796 / 1798
页数:3
相关论文
共 12 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]   A phase-locked shear-force microscope for distance regulation in near-field optical microscopy [J].
Atia, WA ;
Davis, CC .
APPLIED PHYSICS LETTERS, 1997, 70 (04) :405-407
[3]   Nonoptical tip sample distance control for scanning near-field optical microscopy [J].
Chuang, YH ;
Wang, CJ ;
Huang, JY ;
Pan, CL .
APPLIED PHYSICS LETTERS, 1996, 69 (22) :3312-3314
[4]   Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor [J].
Edwards, H ;
Taylor, L ;
Duncan, W ;
Melmed, AJ .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (03) :980-984
[5]  
Kanbayashi S., 1976, Proceedings of the 30th Annual Symposium on Frequency Control, P167
[6]   PIEZOELECTRIC TIP-SAMPLE DISTANCE CONTROL FOR NEAR-FIELD OPTICAL MICROSCOPES [J].
KARRAI, K ;
GROBER, RD .
APPLIED PHYSICS LETTERS, 1995, 66 (14) :1842-1844
[7]   ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J].
MARTIN, Y ;
WILLIAMS, CC ;
WICKRAMASINGHE, HK .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) :4723-4729
[8]   A self-sensitive probe composed of a piezoelectric tuning fork and a bent optical fiber tip for scanning near-field optical/atomic force microscopy [J].
Muramatsu, H ;
Yamamoto, N ;
Umemoto, T ;
Homma, K ;
Chiba, N ;
Fujihira, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (9A) :5753-5758
[9]   Dynamic behavior of tuning fork shear-force feedback [J].
Ruiter, AGT ;
Veerman, JA ;
vanderWerf, KO ;
vanHulst, NF .
APPLIED PHYSICS LETTERS, 1997, 71 (01) :28-30
[10]   Tuning fork shear-force feedback [J].
Ruiter, AGT ;
van der Werf, KO ;
Veerman, JA ;
Garcia-Parajo, MF ;
Rensen, WHJ ;
van Hulst, NF .
ULTRAMICROSCOPY, 1998, 71 (1-4) :149-157