Studies of etching effects on triple-GEM detectors operated with CF4-based gas mixtures

被引：14

作者：

Alfonsi, M ^{[1
]}

Baccaro, S

Bencivenni, G

Bonivento, W

Cardini, A

de Simone, P

Murtas, F

Pinci, D

Lener, MP

Raspino, D

Saitta, B

机构：

[1] Ist Nazl Fis Nucl, Lab Nazl Frascati, Frascati, Italy

[2] Ist Nazl Fis Nucl, Sez Cagliari, Calgary, AB, Canada

[3] ENEA, FIS, ION, Rome, Italy

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2005年 / 52卷 / 06期

关键词：

aging; discharge PACS : 29.40.Cs; GEM; tracking; 29.40.Gx;

D O I：

10.1109/TNS.2005.855640

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present the results of a global irradiation test of full size triple-GEM detectors operated with a CF4-based gas mixture. This study has been performed in the framework of an R&D activity on detectors for the innermost region of the first muon station of the LHCb experiment. The prototypes have been irradiated at the Calliope facility of the ENEA-Casaccia with a high intensity 1.25 MeV gamma from a Co-60 source. After the irradiation test the detectors' performances have been measured with X-rays and with a 3 GeV pion beam at CERN. A SEM analysis on several samples of the detectors has been performed to complete the understanding of the physical processes occurring in the GEM detector during the strong irradiation.

引用

页码：2872 / 2878

页数：7

共 8 条

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