Studies of etching effects on triple-GEM detectors operated with CF4-based gas mixtures

被引：14
|
作者：
Alfonsi, M [1 ]
Baccaro, S
Bencivenni, G
Bonivento, W
Cardini, A
de Simone, P
Murtas, F
Pinci, D
Lener, MP
Raspino, D
Saitta, B
机构：
[1] Ist Nazl Fis Nucl, Lab Nazl Frascati, Frascati, Italy
[2] Ist Nazl Fis Nucl, Sez Cagliari, Calgary, AB, Canada
[3] ENEA, FIS, ION, Rome, Italy
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2005年 / 52卷 / 06期
关键词：
aging; discharge PACS : 29.40.Cs; GEM; tracking; 29.40.Gx;
D O I：
10.1109/TNS.2005.855640
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present the results of a global irradiation test of full size triple-GEM detectors operated with a CF4-based gas mixture. This study has been performed in the framework of an R&D activity on detectors for the innermost region of the first muon station of the LHCb experiment. The prototypes have been irradiated at the Calliope facility of the ENEA-Casaccia with a high intensity 1.25 MeV gamma from a Co-60 source. After the irradiation test the detectors' performances have been measured with X-rays and with a 3 GeV pion beam at CERN. A SEM analysis on several samples of the detectors has been performed to complete the understanding of the physical processes occurring in the GEM detector during the strong irradiation.
引用
收藏
页码：2872 / 2878
页数：7
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