4D imaging of polymer electrolyte membrane fuel cell catalyst layers by soft X-ray spectro-tomography

被引:33
作者
Wu, Juan [1 ]
Melo, Lis G. A. [1 ]
Zhu, Xiaohui [1 ]
West, Marcia M. [2 ]
Berejnov, Viatcheslav [3 ]
Susac, Darija [3 ]
Stumper, Juergen [3 ]
Hitchcock, Adam P. [1 ]
机构
[1] McMaster Univ, Dept Chem & Chem Biol, Hamilton, ON L8S 4M1, Canada
[2] McMaster Univ, Dept Pathol, Hamilton, ON L8N 3Z5, Canada
[3] Automot Fuel Cell Cooperat AFCC Corp, Burnaby, BC V5J 5J8, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
X-ray microscopy; Tomography; 3D ionomer distributions; STXM; Compressed sensing; Radiation damage; RADIATION-DAMAGE; NEXAFS MICROSCOPY; CATHODE CATALYST; VISUALIZATION; IONOMER; BEAMLINE; SPECTROMICROSCOPY; RECONSTRUCTION; RESOLUTION; PEMFC;
D O I
10.1016/j.jpowsour.2018.01.074
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
4D imaging- the three-dimensional distributions of chemical species determined using multi-energy X-ray tomography - of cathode catalyst layers of polymer electrolyte membrane fuel cells (PEM-FC) has been measured by scanning transmission x-ray microscopy (STXM) spectro-tomography at the C is and F is edges. In order to monitor the effects of radiation damage on the composition and 3D structure of the perfluorosulfonic acid (PFSA) ionomer, the same volume was measured 3 times sequentially, with spectral characterization of that same volume at several time points during the measurements. The changes in the average F is spectrum of the ionomer in the cathode as the measurements progressed gave insights into the degree of chemical modification, fluorine mass loss, and changes in the 3D distributions of ionomer that accompanied the spectro-tomographic measurement. The PFSA ionomer-in-cathode is modified both chemically and physically by radiation damage. The 3D volume decreases anisotropically. By reducing the incident flux, partial defocusing (50 rim spot size), limiting the number of tilt angles to 14, and using compressed sensing reconstruction, we show it is possible to reproducibly measure the 3D structure of ionomer in PEM-FC cathodes at ambient temperature while causing minimal radiation damage.
引用
收藏
页码:72 / 83
页数:12
相关论文
共 67 条
[1]   NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space [J].
Ade, Harald ;
Hitchcock, Adam P. .
POLYMER, 2008, 49 (03) :643-675
[2]  
[Anonymous], 1979, IEEE T SYST MAN CYBE, DOI DOI 10.1109/TSMC.1979.4310076
[3]  
Berejnov V., 2013, ECS Trans, V50, P361, DOI DOI 10.1149/05002.0361ECST
[4]   Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source [J].
Bluhm, H ;
Andersson, K ;
Araki, T ;
Benzerara, K ;
Brown, GE ;
Dynes, JJ ;
Ghosal, S ;
Gilles, MK ;
Hansen, HC ;
Hemminger, JC ;
Hitchcock, AP ;
Ketteler, G ;
Kilcoyne, ALD ;
Kneedler, E ;
Lawrence, JR ;
Leppard, GG ;
Majzlan, J ;
Mun, BS ;
Myneni, SCB ;
Nilsson, A ;
Ogasawara, H ;
Ogletree, DF ;
Pecher, K ;
Salmeron, M ;
Shuh, DK ;
Tonner, B ;
Tyliszczak, T ;
Warwick, T ;
Yoon, TH .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2006, 150 (2-3) :86-104
[5]  
Bonse U., 2006, SPIE P, V6318
[6]   Soft X-ray microscopy at a spatial resolution better than 15nm [J].
Chao, WL ;
Harteneck, BD ;
Liddle, JA ;
Anderson, EH ;
Attwood, DT .
NATURE, 2005, 435 (7046) :1210-1213
[7]   Characterization of the effects of soft X-ray irradiation on polymers [J].
Coffey, T ;
Urquhart, SG ;
Ade, H .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2002, 122 (01) :65-78
[8]   Imaging and Microanalysis of Thin Ionomer Layers by Scanning Transmission Electron Microscopy [J].
Cullen, D. A. ;
Koestner, R. ;
Kukreja, R. S. ;
Liu, Z. Y. ;
Minko, S. ;
Trotsenko, O. ;
Tokarev, A. ;
Guetaz, L. ;
Meyer, H. M., III ;
Parish, C. M. ;
More, K. L. .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2014, 161 (10) :F1111-F1117
[9]   Stable recovery of sparse overcomplete representations in the presence of noise [J].
Donoho, DL ;
Elad, M ;
Temlyakov, VN .
IEEE TRANSACTIONS ON INFORMATION THEORY, 2006, 52 (01) :6-18
[10]   Control of radiation damage in the TEM [J].
Egerton, R. F. .
ULTRAMICROSCOPY, 2013, 127 :100-108