The correlation between the radial distribution of high-energetic ions and the structural as well as electrical properties of magnetron sputtered ZnO:Al films

被引:28
作者
Bikowski, Andre [1 ]
Welzel, Thomas [1 ]
Ellmer, Klaus [1 ]
机构
[1] Helmholtz Zentrum Berlin Mat & Energie GmbH, Inst Solar Fuels, D-14109 Berlin, Germany
关键词
ZINC-OXIDE; AL FILMS; BOMBARDMENT; RF;
D O I
10.1063/1.4840975
中图分类号
O59 [应用物理学];
学科分类号
摘要
The origin of the pronounced radial distributions of structural and electrical properties of magnetron sputtered ZnO:Al films has been investigated. The film properties were correlated with the radially resolved ion-distribution functions. While the positive ions exhibit low energies and a radial distribution with a maximum intensity opposite the center of the target, the negative ions can have energies up to several hundred eV, depending on the target potential, with a radial distribution with two maxima opposite the erosion tracks. The most prominent positive ion is that of the working gas (Ar+), while the highest flux of the negative ions is measured for negative oxygen O-. The radial distribution of the flux of the high-energetic negative ions can clearly be related to the radial variations of the structural (c-axis lattice parameter, crystallite size) and electronic (resistivity) properties for sputtering from the planar target, which points to the decisive role of the high-energetic negative oxygen ions for the film quality. The relation between the negative ion bombardment and the structural as well as electronic properties can be explained by a qualitative model recently developed by us. The same target has also been investigated in the eroded state. In this case, the limited acceptance angle of the mass spectrometer leads to a misinterpretation of the radial distribution of the flux of the high-energetic negative ions. This effect can be explained by a simulation, based on the assumption that the high-energetic negative ions are mainly accelerated in the cathode (target) sheath perpendicular to the uneven substrate surface. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:10
相关论文
共 26 条
[1]   A comparative study of electronic and structural properties of polycrystalline and epitaxial magnetron-sputtered ZnO:Al and Zn1-xMgxO:Al Films-Origin of the grain barrier traps [J].
Bikowski, Andre ;
Ellmer, Klaus .
JOURNAL OF APPLIED PHYSICS, 2013, 114 (06)
[2]   The impact of negative oxygen ion bombardment on electronic and structural properties of magnetron sputtered ZnO:Al films [J].
Bikowski, Andre ;
Welzel, Thomas ;
Ellmer, Klaus .
APPLIED PHYSICS LETTERS, 2013, 102 (24)
[3]  
Carvajal J.R., 1990, ABSTR SATELL MEET PO, P127
[4]   Magnetron sputtering of transparent conductive zinc oxide: relation between the sputtering parameters and the electronic properties [J].
Ellmer, K .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2000, 33 (04) :R17-R32
[5]  
Ellmer K, 2008, SPRINGER SER MATER S, V104, P1, DOI 10.1007/978-3-540-73612-7
[6]   Interpretation of ion distribution functions measured by a combined energy and mass analyzer [J].
Ellmer, K ;
Wendt, R ;
Wiesemann, K .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2003, 223 (1-3) :679-693
[7]  
Ellmer K, 2008, SPRINGER SER MATER S, V104, P35
[8]   Reactive magnetron sputtering of transparent conductive oxide thin films: Role of energetic particle (ion) bombardment [J].
Ellmer, Klaus ;
Welzel, Thomas .
JOURNAL OF MATERIALS RESEARCH, 2012, 27 (05) :765-779
[9]   On the transmission function of an ion-energy and mass spectrometer [J].
Hamers, EAG ;
van Sark, WGJHM ;
Bezemer, J ;
Goedheer, WJ ;
van der Weg, WF .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1998, 173 (1-2) :91-98
[10]   In situ measurement of mechanical stress in polycrystalline zinc-oxide thin films prepared by magnetron sputtering [J].
Hinze, J ;
Ellmer, K .
JOURNAL OF APPLIED PHYSICS, 2000, 88 (05) :2443-2450