Importance of low-angle grain boundaries in YBa2Cu3O7-δ coated conductors

被引:59
作者
Durrell, J. H. [1 ]
Rutter, N. A. [1 ]
机构
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
基金
英国工程与自然科学研究理事会;
关键词
CRITICAL-CURRENT-DENSITY; CRITICAL CURRENTS; YBCO FILMS; THIN-FILM; SUPERCONDUCTING TAPES; TRANSPORT-PROPERTIES; CURRENT PERCOLATION; TEXTURE DEVELOPMENT; LASER DEPOSITION; SINGLE-CRYSTAL;
D O I
10.1088/0953-2048/22/1/013001
中图分类号
O59 [应用物理学];
学科分类号
摘要
Over the past ten years the perception of grain boundaries in YBa2Cu3O7-delta conductors has changed greatly. They are now not a problem to be eliminated, but an inevitable and potentially favourable part of the material. This change has arisen as a consequence of new manufacturing techniques which result in excellent grain alignment, reducing the spread of grain boundary misorientation angles. At the same time there is considerable recent evidence which indicates that the variation of properties of grain boundaries with mismatch angle is more complex than a simple exponential decrease in critical current. This is due to the fact that low-angle grain boundaries represent a qualitatively different system to high-angle boundaries. The time is therefore right for a targeted review of research into low-angle YBa2Cu3O7-delta grain boundaries. This article does not purport to be a comprehensive review of the physics of grain boundaries as found in YBa2Cu3O7-delta in general; for a broader overview we would recommend that the reader consult the comprehensive review of Hilgenkamp and Mannhart (2002 Rev. Mod. Phys. 74 485). The purpose of this article is to review the origin and properties of the low-angle grain boundaries found in YBa2Cu3O7-delta coated conductors both individually and as a collective system.
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页数:18
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