Elaboration and characterization of yttrium implanted low manganese steel.

被引：7
作者：
Caudron, E
Buscail, H
Cueff, R
Jacob, YP
Stroosnijder, MF
机构：
[1] Univ Blaise Pascal, Equipe Locale, Lab Vellave Elaborat & Etud Mat, F-43006 Le Puy En Velay, France
[2] Commiss European Communities, Joint Res Ctr, Inst Hlth & Consumer Protect, I-21020 Ispra, VA, Italy
来源：
THIN SOLID FILMS | 1999年 / 350卷 / 1-2期
关键词：
steel; yttrium; corrosion; Rutherford backscattering spectroscopy;
D O I：
10.1016/S0040-6090(99)00277-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Low manganese steel samples were yttrium implanted using ion implantation technique. Sample compositions and structures were investigated before and after yttrium implantations to determine the yttrium distribution in low manganese steel. Yttrium implantation depth profiles were characterized using conventional techniques such as X-ray photoelectron spectroscopy (XPS), reflection high energy electron diffraction (RHEED)I X-ray diffraction (XRD), glancing angle X-ray diffraction (GAXRD) and a nuclear analytical method: Rutherford backscattering spectroscopy (RBS). The aim of this study is to show that correlation between composition and structural analyses allows to understand the effect of implanting yttrium in low manganese steel. (C) 1999 Elsevier Science S.A. All rights reserved.
引用
收藏
页码：168 / 172
页数：5
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