Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis

被引:0
|
作者
Lai, TS
Lin, WZ
机构
来源
PRACTICAL HOLOGRAPHY XI AND HOLOGRAPHIC MATERIALS III | 1997年 / 3011卷
关键词
particle-field holography; in-line holography; particle size analysis; recordable depth of view;
D O I
10.1117/12.271349
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A general recording model of in-line far-field holography is first proposed, which includes three illumination modes: divergent, convergent and collimated beam illuminations. The general irradiance distribution on a hologram is then derived from the general recording model. Based on the general irradiance distribution of in-line far-field holography, the analytical solutions of recordable depth of view (RDV) and allowable farthest far-field distance (AFFD) of in-line far-field holography have been given for different illumination modes. The analytical solutions of RDV and AFFD show that AFFD can be not limited if micro-objects are positioned in one special space and illuminated by convergent beams, but RDV isn't improved. When micro-objects are placed in another special space and illuminated by divergent beam, the RDV and AFFD can be improved simultaneously, but recordable object space is split into two sub-spaces. These results are very important for the design of holographic recording system.
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页码:156 / 164
页数:9
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