Research development of measuring methods on the tribology characters for movable MEMS devices: a review

被引:9
作者
Guo, Zhanshe [1 ,2 ]
Feng, Zhou [1 ,2 ]
Fan, Shangchun [1 ,2 ]
Zheng, Dezhi [1 ,2 ]
Zhuang, Haihan [1 ,2 ]
机构
[1] BeiHang Univ, Sch Instrument Sci & Optoelect Engn, Beijing 100083, Peoples R China
[2] Minist Educ, Key Lab Precis Optomechatron Techonol, Beijing 100083, Peoples R China
来源
MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 2009年 / 15卷 / 03期
关键词
STATIC FRICTION; SURFACE; WEAR; MONOLAYER; STICTION; DESIGN; TOPOGRAPHY; SILICON;
D O I
10.1007/s00542-008-0719-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Micro electro-mechanical systems (MEMS) offers great promise for system integration of sensors, actuators and signal processing. However, to the movable MEMS devices, there have always been major obstacles to their realization and reliability in the past-tribology problems. Because of the size effect, the conventional frictional law is no longer feasible to MEMS devices. It is vital to do research on micro-tribology and rebuild a micro-tribology theory in which size effect must be concerned. At the same time, in order to obtain reliable experimental data to support the theory, a feasible measuring method is also necessary. This paper describes two kinds of measuring methods to realize this purpose-on-chip measuring method and off-chip measuring method. Advantages, disadvantages, research status and the application prospect of each kind of methods are all introduced. Finally, development prospect of measuring methods is mentioned.
引用
收藏
页码:343 / 354
页数:12
相关论文
共 46 条
[1]  
ALSEM DH, 2004, MAT RES SOC, V1821, P1
[2]   Alkene based monolayer films as anti-stiction coatings for polysilicon MEMS [J].
Ashurst, WR ;
Yau, C ;
Carraro, C ;
Lee, C ;
Kluth, GJ ;
Howe, RT ;
Maboudian, R .
SENSORS AND ACTUATORS A-PHYSICAL, 2001, 91 (03) :239-248
[3]   Dichlorodimethylsilane as an anti-stiction monolayer for MEMS: A comparison to the octadecyltrichlosilane self-assembled monolayer [J].
Ashurst, WR ;
Yau, C ;
Carraro, C ;
Maboudian, R ;
Dugger, MT .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2001, 10 (01) :41-49
[4]   Influence of substrate material and topography on the tribological behaviour of submicron coatings [J].
Bandorf, R ;
Lüthje, H ;
Wortmann, A ;
Staedler, T ;
Wittorf, R .
SURFACE & COATINGS TECHNOLOGY, 2003, 174 :461-464
[5]  
BEASLEY MA, 2004, P SOC PHOTO-OPT INS, V5334, P98
[6]   Tribology on the macroscale to nanoscale of microelectromechanical system materials: A review [J].
Bhushan, B. .
Proceedings of the Institution of Mechanical Engineers, Part J: Journal of Engineering Tribology, 2001, 215 (01) :1-18
[7]   Nanotribology and nanomechanics of MEMS devices [J].
Bhushan, B .
NINTH ANNUAL INTERNATIONAL WORKSHOP ON MICRO ELECTRO MECHANICAL SYSTEMS, IEEE PROCEEDINGS: AN INVESTIGATION OF MICRO STRUCTURES, SENSORS, ACTUATORS, MACHINES AND SYSTEMS, 1996, :91-98
[8]  
BOUCHAUD J, 2003, SENS ACUTUATORS A, V104, P1
[9]   Innovative process development for a new micro-tribosensor using surface micromachining [J].
Deladi, S ;
de Boer, MJ ;
Krijnen, G ;
Rosén, D ;
Elwenspoek, MC .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2003, 13 (04) :S17-S22
[10]   Degradation of monolayer lubricants for MEMS [J].
Dugger, MT ;
Hohlfelder, RJ ;
Peebles, DE .
RELIABILITY, TESTING, AND CHARACTERIZATION OF MEMS/MOEMS II, 2003, 4980 :138-150