Strong-Coupling Electrostatics in the Presence of Dielectric Inhomogeneities

被引:69
作者
Jho, Y. S. [1 ,2 ]
Kanduc, M. [3 ]
Naji, A. [1 ,4 ]
Podgornik, R. [3 ,5 ]
Kim, M. W. [1 ,2 ]
Pincus, P. A. [1 ,2 ]
机构
[1] Univ Calif Santa Barbara, Mat Res Lab, Santa Barbara, CA 93106 USA
[2] Korea Adv Inst Sci & Technol, Dept Phys, Taejon 305701, South Korea
[3] Jozef Stefan Inst, Dept Theoret Phys, SI-1000 Ljubljana, Slovenia
[4] Univ Calif Santa Barbara, Dept Chem & Biochem, Santa Barbara, CA 93106 USA
[5] Univ Ljubljana, Fac Math & Phys, Dept Phys, SI-1000 Ljubljana, Slovenia
基金
美国国家科学基金会;
关键词
D O I
10.1103/PhysRevLett.101.188101
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We study the strong-coupling (SC) interaction between two like-charged membranes of finite thickness embedded in a medium of higher dielectric constant. A generalized SC theory is applied along with extensive Monte Carlo simulations to study the image charge effects induced by multiple dielectric discontinuities in this system. These effects lead to strong counterion crowding in the central region of the intersurface space upon increasing the solvent-membrane dielectric mismatch and change the membrane interactions from attractive to repulsive at small separations. These features agree quantitatively with the SC theory at elevated couplings or dielectric mismatch where the correlation hole around counterions is larger than the thickness of the central counterion layer.
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页数:4
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