Noncontact Measurement of Complex Permittivity of Electrically Small Samples at Microwave Frequencies

被引:28
作者
Dong, Jing [1 ,2 ]
Shen, Fazhong [3 ]
Dong, Yazhou [4 ]
Wang, Ying [4 ]
Fu, Wenli [4 ]
Li, Huan [1 ]
Ye, Dexin [1 ]
Zhang, Bin [1 ]
Huangfu, Jiangtao [1 ]
Qiao, Shan [5 ]
Sun, Yongzhi [6 ]
Li, Changzhi [7 ]
Ran, Lixin [1 ]
机构
[1] Zhejiang Univ, Lab Appl Res Electromagnet, Hangzhou 310027, Peoples R China
[2] China Ship Dev & Design Ctr, Sci & Technol Electromagnet Compatibil Lab, Wuhan 430064, Peoples R China
[3] China Res Inst Radiowave Propagat, Xinxiang 453003, Peoples R China
[4] Natl Key Lab Sci & Technol Space Microwave, Xian 710100, Peoples R China
[5] Zhejiang Univ, Dept Elect Engn, Hangzhou 310015, Zhejiang, Peoples R China
[6] Nanjing Inst Elect Equipment, Nanjing 210007, Jiangsu, Peoples R China
[7] Texas Tech Univ, Dept Elect & Comp Engn, Lubbock, TX 79409 USA
关键词
Complex permittivity; noncontact measurement; Rayleigh approximation; subwavelength resonance; DIELECTRIC-CONSTANT; LIQUIDS; SYSTEM; RF;
D O I
10.1109/TMTT.2016.2588487
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Noncontact measurements of material parameters have important applications in various fields. In this paper, we propose a noncontact measurement of complex permittivity for electrically small samples at microwave frequencies. Based on Rayleigh approximation, we propose a noncontact measurement approach that can linearly retrieve complex permittivity from the measured impedance change. Using a subwavelength resonance, far-field radiation can be effectively suppressed, and thus the measurement is not notably influenced by unwanted environmental reflection. With the features of simple calibration and noncontact measurement, our method can be widely used in repeated on-site measurements of complex permittivity for small-sized samples at microwave frequencies.
引用
收藏
页码:2883 / 2893
页数:11
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