Effect of deposition conditions on the stoichiometry and structural properties of LiNbO3 thin films deposited by MOCVD

被引:13
作者
Margueron, Samuel [1 ]
Bartasyte, Ausrine [2 ]
Plausinaitiene, Valentina [3 ]
Abrutis, Adulfas [3 ]
Boulet, Pascal [2 ]
Kubilius, Virgaudas [3 ]
Saltyte, Zita [3 ]
机构
[1] Lorraine Univ, EA 4423, LMOPS, 2 Rue E Belin, Metz, France
[2] Lorranine Univ, Inst Jean Lamour, CNRS, UMR 7198, Nancy, France
[3] Vilnius Univ, Vilnius, Lithuania
来源
OXIDE-BASED MATERIALS AND DEVICES IV | 2013年 / 8626卷
关键词
LiNbO3; lithium niobate; films; CVD; stoichiometry; residual stresses; twins; CHEMICAL-VAPOR-DEPOSITION; SOLID SOURCE MOCVD; LITHIUM-NIOBATE; EPITAXIAL-GROWTH; SAPPHIRE;
D O I
10.1117/12.2010105
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Epitaxial LiNbO3 thin films were deposited on C-sapphire substrates by pulsed injection metal organic chemical vapor deposition and atmospheric pressure metal organic chemical vapor deposition. The effect of deposition conditions, such as the ratio of Li/Nb precursors in solution and the deposition pressure, on the phase composition, Li nonstoichiometry, texture, epitaxial quality, residual stresses and formation of twins in LiNbO3 films was studied by means of X-ray diffraction and Raman spectroscopy. It was found that the deposition pressure played an important role in the incorporation of Li2O in the film and the formation of in-plane and out-of-plane twins.
引用
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页数:8
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