Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry

被引：5
作者：
Marzec, M. M. [1 ]
Bernasik, A. [1 ]
Rysz, J. [2 ]
Luzny, W. [1 ]
Budkowski, A. [2 ]
机构：
[1] AGH Univ Sci & Technol, Fac Phys & Appl Comp Sci, PL-30059 Krakow, Poland
[2] Jagiellonian Univ, Smoluchowski Inst Phys, PL-30059 Krakow, Poland
来源：
ELECTROCHIMICA ACTA | 2013年 / 104卷
关键词：
Kelvin probe force microscopy; Secondary ion mass spectrometry; Buried interface; Self-assembled monolayers; Thin polymer film; LEVEL ALIGNMENT; WORK FUNCTION; GOLD; SURFACE; ENERGETICS; MECHANISM; BLENDS; FILMS; CAST; THIN;
D O I：
10.1016/j.electacta.2013.02.128
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
Buried interfaces between a polystyrene (PS) or polar poly(methyl methacrylate) (PMMA) thin film and the gold surface patterned with CH3- and COOH-terminated alkanethiols self-assembled monolayers (SAM) were examined via Kelvin probe force microscopy. Chemical composition of the interface was probed by secondary ion mass spectrometry. The contact potential difference maps measured on the PS and the PMMA films show inverted contrast. This observation is discussed in terms of reorientations of the COOH-SAM net dipole moments induced by interactions with PMMA. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码：462 / 467
页数：6
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