The density of states in thin film copper phthalocyanine measured by Kelvin probe force microscopy

被引：39

作者：

Celebi, K. ^{[1
]}

Jadhav, P. J. ^{[2
]}

Milaninia, K. M. ^{[3
]}

Bora, M. ^{[1
]}

Baldo, M. A. ^{[2
]}

机构：

[1] MIT, Dept Phys, Cambridge, MA 02139 USA

[2] MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA

[3] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA

来源：

APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 08期

关键词：

D O I：

10.1063/1.2976634

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The density of states (DOS) is an important factor in understanding charge transport in organic semiconductors. We use Kelvin probe force microscopy to find the DOS in thin films of copper phthalocyanine (CuPC). We find an exponential DOS with a characteristic energy of 0.11 eV over a 0.5 eV range of the highest occupied molecular orbital of CuPC. We also find that the technique is limited by charge trapping and hysteresis at low DOSs, and nonuniform potential profiles within the CuPC film at high DOSs. (c) 2008 American Institute of Physics.

引用

页数：3

共 13 条

[11] Direct determination of the hole density of states in undoped and doped amorphous organic films with high lateral resolution [J].