Static analysis tools as early indicators of pre-release defect density

被引:138
作者
Nagappan, N [1 ]
Ball, T [1 ]
机构
[1] N Carolina State Univ, Dept Comp Sci, Raleigh, NC 27606 USA
来源
ICSE 05: 27TH INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING, PROCEEDINGS | 2005年
关键词
static analysis tools; defect density; statistical methods; fault-proneness;
D O I
10.1145/1062455.1062558
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
During software development it is helpful to obtain early estimates of the defect density of software components. Such estimates identify fault-prone areas of code requiring further testing. We present an empirical approach for the early prediction of pre-release defect density based on the defects found using static analysis tools. The defects identified by two different static analysis tools are used to fit and predict the actual pre-release defect density for Windows Server 2003. We show that there exists a strong positive correlation between the static analysis defect density and the pre-release defect density determined by testing. Further, the predicted pre-release defect density and the actual pre-release defect density are strongly correlated at a high degree of statistical significance. Discriminant analysis shows that the results of static analysis tools can be used to separate high and low quality components with an overall classification rate of 82.91%.
引用
收藏
页码:580 / 586
页数:7
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