Indium slabs induced structural phase transitions and their effects on the electrical and optical properties of stacked layers of the thermally annealed Cu2O thin films

被引:8
作者
AlGarni, Sabah E. [1 ,2 ]
Qasrawi, A. F. [3 ,4 ]
机构
[1] King Abdulaziz Univ, Fac Sci Al Faisaliah, Phys Dept, Jeddah, Saudi Arabia
[2] Univ Jeddah, Fac Sci, Dept Phys, Jeddah, Saudi Arabia
[3] Arab Amer Univ, Dept Phys, Jenin, Palestine
[4] Atilim Univ, Fac Engn, Grp Phys, TR-06836 Ankara, Turkey
关键词
Cu2O/In/Cu2O; Annealing; Phase transitions; Electronic resistivity; Optical transitions; CUO; ELECTRODEPOSITION; TEMPERATURE; PERFORMANCE;
D O I
10.1016/j.rinp.2019.102901
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this work, the effects of the structural evolutions caused by the insertion of indium slabs (100 nm) between layers of cupric oxide on the electrical and optical properties are investigated. The stacked layers of Cu2O/Cu2O (CC) which are thermally annealed at 500 degrees C in a vacuum media is observed to comprise both of the CuO (45.9%) and Cu2O (54.1%) phases in its structure. The major structural phase of CuO and Cu2O are monoclinic and orthorhombic, respectively. Insertion of indium slabs which is followed by thermal annealing reduced the content of CuO to 29.2% and enriched the content of Cu2O to 70.8%. The CC samples exhibited structural phase transitions from monoclinic CuO to hexagonal Cu2O in the presence of indium and under thermal annealing. The insertion of indium slabs in the samples increased the crystallite size and enhanced the optical transmittance. It also decreased the microstrain, the defect density and the electrical resistivity. The donor states are shifted deeper below the conduction band edge. The nature of optical transitions also changed from direct allowed to direct forbidden with a decrease in the energy band gap values from 2.05 to 0.85 eV upon indium slabs insertion followed by annealing process.
引用
收藏
页数:7
相关论文
共 32 条
[1]   Exploring the Optical Dynamics in the ITO/As2Se3 Interfaces [J].
Al Garni, S. E. ;
Qasrawi, A. F. .
JOURNAL OF ELECTRONIC MATERIALS, 2019, 48 (10) :6319-6326
[2]   Effect of Indium nano-sandwiching on the structural and optical performance of ZnSe films [J].
Al Garni, S. E. ;
Qasrawi, A. F. .
RESULTS IN PHYSICS, 2017, 7 :4168-4173
[3]   n-ZnO/p-Cu2O Heterojunction Electrode: Characterization and Evaluation of Their Photoelectrochemical Properties [J].
Archela, Edson ;
de Camargo, Luan Pereira ;
da Silva Pelissari, Marcelo Rodrigues ;
Dall'Antonia, Luiz Henrique .
INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE, 2019, 14 (04) :3581-3594
[4]   A fresh approach to synthesizing ammonia from air and water [J].
Bezdek M.J. ;
Chirik P.J. .
Nature, 2019, 568 (7753) :464-466
[5]   The n-type conduction of indium-doped Cu2O thin films fabricated by direct current magnetron co-sputtering [J].
Cai, Xing-Min ;
Su, Xiao-Qiang ;
Ye, Fan ;
Wang, Huan ;
Tian, Xiao-Qing ;
Zhang, Dong-Ping ;
Fan, Ping ;
Luo, Jing-Ting ;
Zheng, Zhuang-Hao ;
Liang, Guang-Xing ;
Roy, V. A. L. .
APPLIED PHYSICS LETTERS, 2015, 107 (08)
[6]   The fabrication of Al/p-Si (MS) type photodiode with (%2 ZnO-doped CuO) interfacial layer by sol gel method and their electrical characteristics [J].
Cetinkaya, Hayriye Gokcen ;
Sevgili, Omer ;
Altindal, Semsettin .
PHYSICA B-CONDENSED MATTER, 2019, 560 :91-96
[7]   Synthesis of Highly Monodisperse Cu2O Nanocrystals and Their Applications as Hole-Transporting Layers in Solution-Processed Light-Emitting Diodes [J].
Chen, Desui ;
Li, Yifei ;
Dai, Xingliang ;
Du, Hui ;
Lin, Jian ;
Jin, Yizheng .
CHEMISTRY-A EUROPEAN JOURNAL, 2019, 25 (65) :14767-14770
[8]   High electrochemical performance and lithiation-delithiation phase evolution in CuO thin films for Li-ion storage [J].
Chen, Wenhao ;
Zhang, Hong ;
Ma, Zhiyuan ;
Yang, Bao ;
Li, Zhicheng .
JOURNAL OF MATERIALS CHEMISTRY A, 2015, 3 (27) :14202-14209
[9]   Multi-Level Cell Properties of a Bilayer Cu2O/Al2O3 Resistive Switching Device [J].
Deuermeier, Jonas ;
Kiazadeh, Asal ;
Klein, Andreas ;
Martins, Rodrigo ;
Fortunato, Elvira .
NANOMATERIALS, 2019, 9 (02)
[10]   Effect of post-annealing on the properties of copper oxide thin films obtained from the oxidation of evaporated metallic copper [J].
Figueiredo, V. ;
Elangovan, E. ;
Goncalves, G. ;
Barquinha, P. ;
Pereira, L. ;
Franco, N. ;
Alves, E. ;
Martins, R. ;
Fortunato, E. .
APPLIED SURFACE SCIENCE, 2008, 254 (13) :3949-3954