Low energy off-axis holography in electron microscopy

被引：18
作者：
Morin, P
Pitaval, M
Vicario, E
机构：
[1] Departement de Physique des Matériaux, UMR5586 CNRS-Université Claude Bernard Lyon-1, Villeurbanne
来源：
PHYSICAL REVIEW LETTERS | 1996年 / 76卷 / 21期
关键词：
D O I：
10.1103/PhysRevLett.76.3979
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A new technique of microscopic investigation is proposed by combining projection electron microscopy and off-axis holography. On the basis of the strong scattering of low energy electrons by light elements, this technique would be suitable for the observation of organic materials with a resolution better than 1 nm. A model has been developed to reconstruct the observed object from the holograms. Preliminary experimental results are obtained at medium resolution: 7 nm on networks of carbon fibers.
引用
收藏
页码：3979 / 3982
页数：4
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