Low energy off-axis holography in electron microscopy

被引：18
作者：
Morin, P
Pitaval, M
Vicario, E
机构：
[1] Departement de Physique des Matériaux, UMR5586 CNRS-Université Claude Bernard Lyon-1, Villeurbanne
来源：
PHYSICAL REVIEW LETTERS | 1996年 / 76卷 / 21期
关键词：
D O I：
10.1103/PhysRevLett.76.3979
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A new technique of microscopic investigation is proposed by combining projection electron microscopy and off-axis holography. On the basis of the strong scattering of low energy electrons by light elements, this technique would be suitable for the observation of organic materials with a resolution better than 1 nm. A model has been developed to reconstruct the observed object from the holograms. Preliminary experimental results are obtained at medium resolution: 7 nm on networks of carbon fibers.
引用
收藏
页码：3979 / 3982
页数：4
相关论文
共 16 条
[1]  
[Anonymous], 1991, Advances in optical and electron microscopy
[2]  
BINH VT, 1995, ULTRAMICROSCOPY, V58, P307
[3]  
BORN M, 1993, PRINCIPLES OPTICS, P382
[4]   HOLOGRAPHY WITH LOW-ENERGY ELECTRONS [J].
FINK, HW ;
STOCKER, W ;
SCHMID, H .
PHYSICAL REVIEW LETTERS, 1990, 65 (10) :1204-1206
[5]   ATOMIC RESOLUTION IN LENSLESS LOW-ENERGY ELECTRON HOLOGRAPHY [J].
FINK, HW ;
SCHMID, H ;
KREUZER, HJ ;
WIERZBICKI, A .
PHYSICAL REVIEW LETTERS, 1991, 67 (12) :1543-1546
[6]   MICROSCOPY BY RECONSTRUCTED WAVE-FRONTS [J].
GABOR, D .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1949, 197 (1051) :454-+
[7]   COHERENT ELECTRON-BEAMS AND SOURCES [J].
GARCIA, N ;
ROHRER, H .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1989, 1 (23) :3737-3742
[8]   THEORY OF THE POINT-SOURCE ELECTRON-MICROSCOPE [J].
KREUZER, HJ ;
NAKAMURA, K ;
WIERZBICKI, A ;
FINK, HW ;
SCHMID, H .
ULTRAMICROSCOPY, 1992, 45 (3-4) :381-403
[9]   ELECTRON HOLOGRAPHY APPROACHING ATOMIC RESOLUTION [J].
LICHTE, H .
ULTRAMICROSCOPY, 1986, 20 (03) :293-304
[10]   POINT-SOURCE PHYSICS - APPLICATION TO ELECTRON PROJECTION MICROSCOPY AND HOLOGRAPHY [J].
MORIN, R .
MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1994, 5 (4-6) :501-508
12