Measurement of complex dielectric permittivity of partially inserted samples in a cavity perturbation technique

被引：9

作者：

Subramanian, V

Sivasubramanian, V

Murthy, VRK

Sobhanadri, J

机构：

[1] Microwave Laboratory, Department of Physics, Indian Institute of Technology

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1996年 / 67卷 / 01期

关键词：

D O I：

10.1063/1.1146548

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Suitable correction factors are incorporated in the measurement of shift in resonance frequency and full width at half-maximum in the cavity perturbation technique when the sample is inserted partially into the cavity. The present approach is observed to be more accurate compared to the available theories and it does not have limitations concerning the shape of the sample. Several standard samples are taken for the present measurement and compared with the full insertion method. Some of the samples are partially inserted into the cavity step by step and the experimental results are compared with the present approach and that of Lehndroff. (C) 1996 American Institute of Physics.

引用

页码：279 / 282

页数：4

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