Hardware-Assisted Cooperative Integration of Wear-Leveling and Salvaging for Phase Change Memory

被引:11
作者
Jiang, Lei [1 ]
Du, Yu [2 ]
Zhao, Bo [1 ]
Zhang, Youtao [2 ]
Childers, Bruce R. [2 ]
Yang, Jun [1 ]
机构
[1] Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15260 USA
[2] Univ Pittsburgh, Dept Comp Sci & Engn, Pittsburgh, PA USA
基金
美国国家科学基金会;
关键词
Design; Reliability; Performance; Salvaging; wear-leveling; hard faults; phase change memory; ECC;
D O I
10.1145/2459316.2459318
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Phase Change Memory (PCM) has recently emerged as a promising memory technology. However, PCM's limited write endurance restricts its immediate use as a replacement for DRAM. To extend the lifetime of PCM chips, wear-leveling and salvaging techniques have been proposed. Wear-leveling balances write operations across different PCM regions while salvaging extends the duty cycle and provides graceful degradation for a nonnegligible number of failures. Current wear-leveling and salvaging schemes have not been designed and integrated to work cooperatively to achieve the best PCM device lifetime. In particular, a noncontiguous PCM space generated from salvaging complicates wear-leveling and incurs large overhead. In this article, we propose LLS, a Line-Level mapping and Salvaging design. By allocating a dynamic portion of total space in a PCM device as backup space, and mapping failed lines to backup PCM, LLS constructs a contiguous PCM space and masks lower-level failures from the OS and applications. LLS integrates wear-leveling and salvaging and copes well with modern OSes. Our experimental results show that LLS achieves 31% longer lifetime than the state-of-the-art. It has negligible hardware cost and performance overhead.
引用
收藏
页码:1 / 25
页数:25
相关论文
共 37 条
[11]   Dynamically Replicated Memory: Building Reliable Systems from Nanoscale Resistive Memories [J].
Ipek, Engin ;
Condit, Jeremy ;
Nightingale, Edmund B. ;
Burger, Doug ;
Moscibroda, Thomas .
ACM SIGPLAN NOTICES, 2010, 45 (03) :3-14
[12]  
Kim K., 2005, P 43 IEEE INT REL PH
[13]  
Lai S., 2003, IEDM, P1
[14]  
LAI S, 2001, P IEEE INT EL DEV M
[15]  
Lee BC, 2009, CONF PROC INT SYMP C, P2, DOI 10.1145/1555815.1555758
[16]  
Lee M., 2008, US patent application, Patent No. [12/266,222, 12266222]
[17]  
Lei Jiang, 2011, 2011 International Symposium on Low Power Electronics and Design (ISLPED 2011), P127, DOI 10.1109/ISLPED.2011.5993624
[18]   Explanation of programming distributions in phase-change memory arrays based on crystallization time statistics [J].
Mantegazza, D. ;
Ielmini, D. ;
Pirovano, A. ;
Lacaita, A. L. ;
Varesi, E. ;
Pellizzer, F. ;
Bez, R. .
SOLID-STATE ELECTRONICS, 2008, 52 (04) :584-590
[19]  
NVIDIA, 2010, NVID GEFORCE GTX 480
[20]  
Qureshi Moinuddin K., 2009, Proceedings of the 2009 42nd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO 2009), P14, DOI 10.1145/1669112.1669117