Effects of Composition and Volume on the Microstructure of SnAgCu Solder Balls

被引:0
|
作者
Mueller, Maik [1 ]
Wiese, Steffen [1 ]
Wolter, Klaus-Juergen [1 ]
机构
[1] Tech Univ Dresden, Elect Packaging Lab IAVT, D-01062 Dresden, Germany
来源
ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS | 2008年
关键词
D O I
10.1109/ESTC.2008.4684444
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this study the solder alloys SnAg3.5, SnCu0.7, SnAg3.0Cu0.5, SnAg2.7Cu0.4Ni0.005 and SnAg3.8Cu0.7 have been analysed in order to determine variations in microstructure caused by cooling rate, solder composition and ball diameter. These specimens have been melted and solidified on an alumina substrate in order to prevent compositional changes due to interfacial reactions. The ball diameter was varied from approx. empty set 1100 mu m to empty set 130 mu m. Cooling rates of 0.14 K/s, 1.1 K/s and 10.9 K/s have been investigated. Cross sections of these specimens were analysed by optical light microscopy. The results show that the formation of primary intermetallics in these solder alloys depends on cooling rate and not only on composition. The analysis of grain orientation by polarized light microscopy points out the influences of volume and composition on the solder. The results also indicate that the grain structure becomes finer with smaller volume. A special solidification phenomena, which causes an abrupt change of grain size in a solder ball has been investigated for the SnAg3.0Cu0.5 alloy. It will be shown that this effect is connected with a change in the solidification process itself. In determine the influence on the solidification process caused by the interfacial reaction, experiments on Cu/Sn and Ni/Au metallisations have been carried out.
引用
收藏
页码:749 / 755
页数:7
相关论文
共 50 条
  • [21] Effects of Solder Paste Volume and Reflow Profiles on the Thermal Cycling Performance of Mixed SnAgCu/SnPb Solder Joints
    Borgesen, Peter
    Meilunas, Michael
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2011, 1 (08): : 1205 - 1213
  • [22] Effects of small amount addition of rare earth Er on microstructure and property of SnAgCu solder
    Shi, Yaowu
    Tian, Jun
    Hao, Hu
    Xia, Zhidong
    Lei, Yongping
    Guo, Fu
    Journal of Alloys and Compounds, 2008, 453 (1-2): : 180 - 184
  • [23] Effects of Aging on Interfacial Microstructure and Reliability Between SnAgCu Solder and FeNi/Cu UBM
    Zhu, Qing-Sheng
    Guo, Jian-Jun
    Shang, Pan-Ju
    Wang, Zhong-Guang
    Shang, Jian-Ku
    ADVANCED ENGINEERING MATERIALS, 2010, 12 (06) : 497 - 503
  • [24] The influence of size and composition on the creep of SnAgCu solder joints
    Wiese, S.
    Roellig, M.
    Mueller, M.
    Rzepka, S.
    Nocke, K.
    Luhmann, C.
    Kraemer, F.
    Meier, K.
    Wolter, K. -J.
    ESTC 2006: 1ST ELECTRONICS SYSTEMINTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2006, : 912 - +
  • [25] Effects of Thermal Aging and Electromigration on Tensile Strength of SnAgCu Solder Joints with Different Volume
    Wang, Gang
    Yin, Li-Meng
    Yao, Zong-Xiang
    Wang, Jin-Zhao
    2016 17TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2016, : 753 - 756
  • [26] Microstructure characterization of SnAgCu solder bearing Ce for electronic packaging
    Zhang, Liang
    Xue, Song-bai
    Gao, Li-li
    Dai, Wei
    Ji, Feng
    Chen, Yan
    Yu, Sheng-lin
    MICROELECTRONIC ENGINEERING, 2011, 88 (09) : 2848 - 2851
  • [27] Microstructure, creep properties, and failure mechanism of SnAgCu solder joints
    Janne J. Sundelin
    Sami T. Nurmi
    Toivo K. Lepistö
    Eero O. Ristolainen
    Journal of Electronic Materials, 2006, 35 : 1600 - 1606
  • [28] Microstructure, creep properties, and failure mechanism of SnAgCu solder joints
    Sundelin, Janne J.
    Nurmi, Sami T.
    Lepisto, Toivo K.
    Ristolainen, Eero O.
    JOURNAL OF ELECTRONIC MATERIALS, 2006, 35 (07) : 1600 - 1606
  • [29] Effects of aging and thermal cycling on the microstructure and shear strength of SnAgCu surface mount solder joint
    Shawkret, A.
    Du, L.
    Sun, Z.
    Sheng, M.
    Luo, L.
    Jinshu Xuebao/Acta Metallurgica Sinica, 2001, 37 (04): : 439 - 444
  • [30] Effects of aging and thermal cycling on the microstructure and shear strength of SnAgCu surface mount solder joint
    Shawkret, A
    Du, LQ
    Sun, ZG
    Sheng, M
    Luo, L
    ACTA METALLURGICA SINICA, 2001, 37 (04) : 439 - 444