共 50 条
- [2] New photothermal deflection method for thermal diffusivity measurement of semiconductor wafers REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (03): : 1521 - 1526
- [3] A cryostatic setup for the low-temperature measurement of thermal diffusivity with the photothermal method REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (12): : 5598 - 5602
- [4] Cryostatic setup for the low-temperature measurement of thermal diffusivity with the photothermal method Bertolotti, M., 1600, American Inst of Physics, Woodbury, NY, United States (66):
- [9] New contactless method for thermal diffusivity measurements using modulated photothermal radiometry REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (05):
- [10] Thermal diffusivity measurement of thin wires using photothermal deflection Barkyoumb, J.H., 1600, American Inst of Physics, Woodbury, NY, United States (78):