One-sided run rules control charts for monitoring the coefficient of variation in short production runs

被引：17

作者：

Amdouni, Asma ^{[1
]}

Castagliola, Philippe ^{[2
,3
]}

Taleb, Hassen ^{[4
]}

Celano, Giovanni ^{[5
]}

机构：

[1] Univ Libre Tunis, Dept Genie Informat & Telecommun, 32 Ave Kheireddine Pacha, Tunis 1002, Tunisia

[2] Univ Nantes, Nantes, France

[3] LUNAM Univ, IRCCyN, CNRS, UMR 6597, Nantes, France

[4] Univ Carthage, Higher Inst Business & Accounting, ARBRE Lab, Tunis, Tunisia

[5] Univ Catania, Dept Civil Engn & Architecture, Viale Andrea Doria 6, I-95125 Catania, Italy

来源：

EUROPEAN JOURNAL OF INDUSTRIAL ENGINEERING | 2016年 / 10卷 / 05期

关键词：

coefficient of variation; short production runs; Markov chain; truncated run length; SHEWHART;

D O I：

10.1504/EJIE.2016.078804

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper proposes a new efficient method to monitor the coefficient of variation (CV) in a short production run context by means of one-sided run rules type charts. Plotting points on run rules control charts is a stochastic process modelled in this paper by using Markov chains to get their main statistical properties. Proofs concerning the computation of the truncated run length properties are given. Tables summarising the main numerical results for several combinations of in-control CV values, sample sizes and shift sizes are provided. Moreover, a comparison analysis has been performed to show that implementing one-sided run rules type charts is the best decision most of the time. Finally, an example illustrates the use of these charts on real data.

引用

页码：639 / 663

页数：25

共 27 条

[1]

Amdouni A., 2014, 3 SMTDA C P 11 14 JU, P33

[2]

[Anonymous], 1999, Introduction to matrix analytic methods in stochastic modeling, DOI DOI 10.1137/1.9780898719734

[3] BAYESIAN PROCESS-CONTROL FOR ATTRIBUTES [J].