SiC Solid-State Disconnect for High Power System Applications

被引:0
|
作者
Li, Xueqing [1 ]
Alexandrov, Petre [1 ]
Fursin, Leonid [1 ]
Dries, Christopher [1 ]
Zhao, Jian H. [2 ]
机构
[1] United Silicon Carbide Inc, 7 Deer Pk Dr,Suite E, Monmouth Jct, NJ 08852 USA
[2] Rutgers State Univ, SiCLAB, Dept ECE, Piscataway, NJ 08854 USA
来源
SILICON CARBIDE AND RELATED MATERIALS 2011, PTS 1 AND 2 | 2012年 / 717-720卷
关键词
Solid-State Disconnect; Circuit Breaker; Depletion-Mode JFET; Surge Current Protection;
D O I
10.4028/www.scientific.net/MSF.717-720.1249
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper reports the design and experimental demonstration of a novel bi-directional solid-state disconnect (SSD) based on Silicon Carbide (SiC) depletion-mode junction field effect transistors (JFETs) for protecting critical sensitive components in high power systems. The SSD is able to provide a fast disconnect action upon receiving a preset trip current flowing through it and has a very low insertion loss, which makes it suitable for high power applications. For the application in 150kW six-phase power inverter systems, an insertion loss of less than 0.91% and a current fall time of less than 20 mu s for trip currents of about 800A have been demonstrated experimentally. To the best of our knowledge, there are no other solid-state disconnects available of comparable parameters.
引用
收藏
页码:1249 / +
页数:2
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