Role of defects in tailoring structural, electrical and optical properties of ZnO

被引：321

作者：

Dutta, Sreetama ^{[1
]}

Chattopadhyay, S. ^{[2
]}

Sarkar, A. ^{[3
]}

Chakrabarti, Mahuya ^{[4
]}

Sanyal, D. ^{[4
]}

Jana, D. ^{[1
]}

机构：

[1] Univ Calcutta, Dept Phys, Kolkata 700009, W Bengal, India

[2] Taki Govt Coll, Dept Phys, Taki 743429, India

[3] Bangabasi Morning Coll, Dept Phys, Kolkata 700009, W Bengal, India

[4] VECC, Kolkata 700064, W Bengal, India

来源：

PROGRESS IN MATERIALS SCIENCE | 2009年 / 54卷 / 01期

关键词：

POSITRON ANNIHILATION RADIATION; DOPPLER-BROADENING MEASUREMENTS; FINE-GRAINED MATERIALS; RANDOM LASER ACTION; X-RAY-DIFFRACTION; ZINC-OXIDE FILMS; THIN-FILMS; ABSORPTION-EDGE; ELECTRONIC-STRUCTURE; POLYCRYSTALLINE ZNO;

D O I：

10.1016/j.pmatsci.2008.07.002

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this short topical review, a brief account of the evolution of defects due to controlled changes in polycrystalline zinc oxide has been presented. X-ray diffraction, Positron annihilation spectroscopy and optical absorption spectroscopy has been employed to understand various defective states of ZnO. Thermogravimetric analysis, room temperature resistivity and photoluminescence measurements (just mentioned) have been used to throw more light on this topic. A coherent scenario in the light of previous works in this field has been discussed. At the end discussion on the magnetic studies on ZnO-based systems has been added in short. (C) 2008 Elsevier Ltd. All rights reserved.

引用

页码：89 / 136

页数：48

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