Reliability Aspects and Performance Analysis of Single Electron Threshold Logic Based Programmable Logic Array

This paper deals with the single electron threshold logic gate based programmable logic array design and different performance related issues. The main concern of this work is the reliability aspects in presence of randomly distributed background charges and under consideration of different shapes of island. Two types of distribution, namely normal and uniform distribution has been taken into consideration to analyze the reliability of the complete circuit along with the effects from individual logic gates. Regarding island shape circular disc and sphere shaped island have been considered. The work also focuses on the power consumption, time delay estimations and tunneling rate determination to estimate the performance of the designed circuit. The effect of error probability on the propagation delay of the designed circuit is thoroughly investigated. The reliability analysis reveals that the better percentage reliability of the complete circuit is achieved with the normal distribution of background charges. The stability of the designed circuit has been tested using SIMON. All the points corresponding to the control input vectors are found to be located in the stable white portion of the stability plot. Through the simulated stability plots the stable operation of the circuit is also explained.