Characterization of preferred orientation of silver film on copper substrates by x-ray diffraction

被引：1

作者：

Li, Taotao ^{[1
,2
]}

Dang, Ning ^{[3
]}

Liang, Wei ^{[1
,2
]}

机构：

[1] Taiyuan Univ Technol, Coll Mat Sci & Engn, Taiyuan 030024, Shanxi, Peoples R China

[2] Taiyuan Univ Technol, Shanxi Key Lab Adv Magnesium Based Mat, Taiyuan 030024, Shanxi, Peoples R China

[3] Univ Lorraine, Lab Chim Phys & Microbiol Mat & Environm LCPME, UMR 7564, CNRS, F-54600 Villers Les Nancy, France

来源：

MATERIALS RESEARCH EXPRESS | 2019年 / 6卷 / 01期

基金：

中国国家自然科学基金;

关键词：

silver; preferred orientation; bi-pyramids; < 311 >; PARTICLE-SIZE; THIN-FILMS; TEXTURE; GROWTH; AG;

D O I：

10.1088/2053-1591/aae60e

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Silver films were deposited on copper plates in a typical niacin plating system. X-ray diffraction techniques were used to investigate the preferred orientation of the silver film on copper plates. With the increase of the current density, the growth direction of the preferred silver grains < 111 > is extended to a larger coning angle, which will increase the integrated diffraction intensity {311}. The averaged silver grains are bi-pyramids rather than cylinders.

引用

页数：6

共 19 条

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