Characterization of preferred orientation of silver film on copper substrates by x-ray diffraction

被引：1

作者：

Li, Taotao ^{[1
,2
]}

Dang, Ning ^{[3
]}

Liang, Wei ^{[1
,2
]}

机构：

[1] Taiyuan Univ Technol, Coll Mat Sci & Engn, Taiyuan 030024, Shanxi, Peoples R China

[2] Taiyuan Univ Technol, Shanxi Key Lab Adv Magnesium Based Mat, Taiyuan 030024, Shanxi, Peoples R China

[3] Univ Lorraine, Lab Chim Phys & Microbiol Mat & Environm LCPME, UMR 7564, CNRS, F-54600 Villers Les Nancy, France

来源：

MATERIALS RESEARCH EXPRESS | 2019年 / 6卷 / 01期

基金：

中国国家自然科学基金;

关键词：

silver; preferred orientation; bi-pyramids; < 311 >; PARTICLE-SIZE; THIN-FILMS; TEXTURE; GROWTH; AG;

D O I：

10.1088/2053-1591/aae60e

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Silver films were deposited on copper plates in a typical niacin plating system. X-ray diffraction techniques were used to investigate the preferred orientation of the silver film on copper plates. With the increase of the current density, the growth direction of the preferred silver grains < 111 > is extended to a larger coning angle, which will increase the integrated diffraction intensity {311}. The averaged silver grains are bi-pyramids rather than cylinders.

引用

页数：6

共 19 条

[1] VOIGT-FUNCTION MODELING IN FOURIER-ANALYSIS OF SIZE-BROADENED AND STRAIN-BROADENED X-RAY-DIFFRACTION PEAKS [J].

BALZAR, D ;

LEDBETTER, H .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1993, 26 (pt 1) :97-103

[2] Influence of sputtering mechanisms on the preferred orientation of aluminum nitride thin films [J].

Clement, M ;

Iborra, E ;

Sangrador, J ;

Sanz-Hervás, A ;

Vergara, L ;

Aguilar, M .

JOURNAL OF APPLIED PHYSICS, 2003, 94 (03) :1495-1500

[3]

Danilchenko SN, 2015, CRYST RES TECHNOL, V37, P1234

[4] CORRECTION OF INTENSITIES FOR PREFERRED ORIENTATION IN POWDER DIFFRACTOMETRY - APPLICATION OF THE MARCH MODEL [J].

DOLLASE, WA .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 (pt 4) :267-272

[5] Growth of Ag thin films on complex surfaces of quasicrystals and approximant phases [J].

Fournée, V ;

Ross, AR ;

Lograsso, TA ;

Evans, JW ;

Thiel, PA .

SURFACE SCIENCE, 2003, 537 (1-3) :5-26

[6]

Halder NC, 2010, ACTA CRYSTALLOGR, V20, P312

[7] The measurement of particle size by the X-ray method [J].

Jones, FW .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1938, 166 (A924) :0016-0043

[8] Comparison of texture evolution in Ag and Ag(Al) alloy thin films on amorphous SiO2 [J].

Kim, HC ;

Theodore, ND ;

Alford, TL .

JOURNAL OF APPLIED PHYSICS, 2004, 95 (09) :5180-5188

[9] RAPID METHOD FOR ANALYZING BREADTHS OF DIFFRACTION AND SPECTRAL-LINES USING VOIGT FUNCTION [J].

LANGFORD, JI .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (FEB) :10-14

[10] TEM observation of general growth behavior for silver electroplating on copper rod [J].

Li, Taotao ;

Dang, Ning ;

Liang, Miaomiao ;

Guo, Chunli ;

Lu, Huihu ;

Ma, Jingyu ;

Liang, Wei .

APPLIED SURFACE SCIENCE, 2018, 451 :148-154

← 1 2 →