Efficient Method for Estimating the Characteristics of Radiation-Induced Current Transients

被引：8

作者：

Bennett, W. G. ^{[1
]}

Schrimpf, R. D. ^{[1
]}

Hooten, N. C. ^{[1
]}

Reed, R. A. ^{[1
]}

Kauppila, J. S. ^{[1
]}

Weller, R. A. ^{[1
]}

Warren, K. M. ^{[1
]}

Mendenhall, M. H. ^{[1
]}

机构：

[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37212 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2012年 / 59卷 / 06期

关键词：

Charge collection; drift transport; efficient characterization; fast transient; Monte-Carlo radiation transport code; prompt response; single-event effects (SEE); single-event transient (SET); SINGLE-EVENT UPSET; SEU; SIMULATION; DEVICES;

D O I：

10.1109/TNS.2012.2218830

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An efficient method for estimating the characteristics of ion-induced current pulse transients is presented and related to the corresponding mechanisms of single-event charge collection. The method is focused on characterizing the prompt response of a reverse biased p-n junction under relatively low level conditions (LET < 10 MeV-cm(-2)/mg). This method is shown to be accurate when compared to 3D finite element simulations, while reducing solution time such that current pulse calculations can be run in series with both energy deposition and circuit simulations.

引用

页码：2704 / 2709

页数：6

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